Surface segregation of interstitial manganese in Ga1xMnxAs studied by hard x-ray photoemission spectroscopy

B. Schmid, A. Müller, M. Sing, R. Claessen, J. Wenisch, C. Gould, K. Brunner, L. Molenkamp, and W. Drube
Phys. Rev. B 78, 075319 – Published 22 August 2008

Abstract

The effects of low-temperature annealing and oxidation of the dilute magnetic semiconductor Ga1xMnxAs are studied by photoemission spectroscopy in the hard x-ray regime (HAXPES), with special attention to the depth profile of both concentration and chemical state of manganese. Annealing of Ga1xMnxAs in air at 190°C for up to 150 h leads to an enrichment of manganese at the surface accompanied by an increase in the native oxide layer. These observations are consistently explained by thermally activated surface segregation of interstitial Mn and its subsequent passivation by oxidation, thereby confirming a recently suggested mechanism for an enhancement of the Curie temperature upon annealing.

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  • Received 19 December 2007

DOI:https://doi.org/10.1103/PhysRevB.78.075319

©2008 American Physical Society

Authors & Affiliations

B. Schmid*, A. Müller, M. Sing, and R. Claessen

  • Experimentelle Physik IV, Physikalisches Institut, Universität Würzburg, Am Hubland, 97072 Würzburg, Germany

J. Wenisch, C. Gould, K. Brunner, and L. Molenkamp

  • Experimentelle Physik III, Physikalisches Institut, Universität Würzburg, Am Hubland, 97072 Würzburg, Germany

W. Drube

  • Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22603 Hamburg, Germany

  • *schmid@physik.uni-wuerzburg.de

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Issue

Vol. 78, Iss. 7 — 15 August 2008

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