Direct real-space imaging of the c(2×8)(2×4) GaAs (001) surface structure

J. J. Kolodziej, M. Goryl, J. Konior, M. Reichling, and M. Szymonski
Phys. Rev. B 76, 245314 – Published 13 December 2007

Abstract

We have performed frequency-modulated atomic-force microscopy (FM-AFM) on the c(2×8)(2×4) GaAs (001) surface obtained from the c(8×2)(4×6) surface by exposing it to As2 gas and annealing. Highly resolved interaction patterns reflect prevailing surface dimer pairs consistent with a so-called β2 structure, but more rare motifs characteristic of α2 and β structures are also seen. Atoms of the dimers interact with the atomic force microscope tip repulsively and appear as sharp features on a smooth background when imaged in constant-height mode. An analysis of the interaction decay length and lateral size of the atomic features indicates that the surface atoms are visualized through a core-core repulsion mechanism. In this imaging mode, the FM-AFM can be regarded as a true surface structure tool, since the observed features are, in the absence of significant lateral relaxation, associated with surface atoms directly.

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  • Received 19 April 2007

DOI:https://doi.org/10.1103/PhysRevB.76.245314

©2007 American Physical Society

Authors & Affiliations

J. J. Kolodziej1,*, M. Goryl1, J. Konior1, M. Reichling2, and M. Szymonski1

  • 1Research Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Faculty of Physics, Astronomy, and Applied Computer Science, Jagiellonian University, Reymonta 4, 30-059 Kraków, Poland
  • 2Department of Physics, Osnabrück University, Barbarastrasse 7, 49076 Osnabrück, Germany

  • *Corresponding author. jkolodz@if.uj.edu.pl

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Issue

Vol. 76, Iss. 24 — 15 December 2007

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