Abstract
We have performed frequency-modulated atomic-force microscopy (FM-AFM) on the GaAs (001) surface obtained from the surface by exposing it to gas and annealing. Highly resolved interaction patterns reflect prevailing surface dimer pairs consistent with a so-called structure, but more rare motifs characteristic of and structures are also seen. Atoms of the dimers interact with the atomic force microscope tip repulsively and appear as sharp features on a smooth background when imaged in constant-height mode. An analysis of the interaction decay length and lateral size of the atomic features indicates that the surface atoms are visualized through a core-core repulsion mechanism. In this imaging mode, the FM-AFM can be regarded as a true surface structure tool, since the observed features are, in the absence of significant lateral relaxation, associated with surface atoms directly.
- Received 19 April 2007
DOI:https://doi.org/10.1103/PhysRevB.76.245314
©2007 American Physical Society