Quantum well states in ultrathin Bi films: Angle-resolved photoemission spectroscopy and first-principles calculations study

T. Hirahara, T. Nagao, I. Matsuda, G. Bihlmayer, E. V. Chulkov, Yu. M. Koroteev, and S. Hasegawa
Phys. Rev. B 75, 035422 – Published 24 January 2007

Abstract

Quantum well states (QWSs) in ultrathin Bi(001) films grown on Si(111)7×7 with thicknesses up to several tens of nanometers were studied by angle-resolved photoemission spectroscopy and first-principles calculations. We observed QWSs at various points in k-space; those located near Γ¯ are very difficult to distinguish while the QWS peaks at off-normal emission (M¯) are clearly resolved and show highly anisotropic features due to the saddle-point-like band dispersion near the Fermi level of bulk Bi along the LX direction. The features of the QWSs are well-reproduced by ab initio calculations for free-standing Bi slabs. The standard method of the phase-shift accumulation model is applied to the QWSs and the bulk band dispersion perpendicular to the surface at finite parallel momentum is experimentally obtained for the first time. The phase shifts at the film interfaces are discussed in detail. The QWSs have little contribution to the electronic structure near the Fermi level and this suggests that the macroscopic physical properties of the films in the thickness of several atomic layers are likely determined by the highly metallic surface states.

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  • Received 25 July 2006

DOI:https://doi.org/10.1103/PhysRevB.75.035422

©2007 American Physical Society

Authors & Affiliations

T. Hirahara1,*, T. Nagao2, I. Matsuda1, G. Bihlmayer3, E. V. Chulkov4,5, Yu. M. Koroteev4,6, and S. Hasegawa1

  • 1Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan
  • 2Nano System Functionality Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
  • 3Institut für Festkörperforschung, Forschungszentrum Jülich, D-52425 Jülich, Germany
  • 4Donostia International Physics Center (DIPC), 20018 San Sebastián/Donostia, Basque Country, Spain
  • 5Departamento de Física de Materiales and Centro Mixto CSIV-UPV/EHU, Facultad de Ciencias Químicas, UPV/EHU, Apartado 1072, 20080 San Sebastián, Basque Country, Spain
  • 6Institute of Strength Physics and Materials Science, Russian Academy of Sciences, 634021, Tomsk, Russia

  • *Electronic address: hirahara@surface.phys.s.u-tokyo.ac.jp

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Issue

Vol. 75, Iss. 3 — 15 January 2007

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