Chemical bonding, interface strength, and oxygen K electron-energy-loss near-edge structure of the CuAl2O3 interface

Teruyasu Mizoguchi, Takeo Sasaki, Shingo Tanaka, Katsuyuki Matsunaga, Takahisa Yamamoto, Masanori Kohyama, and Yuichi Ikuhara
Phys. Rev. B 74, 235408 – Published 7 December 2006

Abstract

Chemical bondings and oxygen K electron-energy-loss near-edge structures (ELNES) of oxygen terminated CuAl2O3 heterointerfaces with hollow and on-top configurations were theoretically investigated by using a first principles orthogonalized linear combination of atomic orbitals method. From the chemical bonding analysis, it was found that the hollow configuration has stronger ionic and covalent bondings as compared with the on-top configuration, and the weakness of the on-top configuration originates from the strong antibonding interactions between an interfacial oxygen and the second near neighbor Cu. Detailed analysis using overlap population diagrams revealed the formation mechanism of the strong antibonding interactions in the on-top configuration. In the oxygen K ELNES calculation, a prepeak feature appears in both configurations and it was predicted that the prepeak for the on-top configuration is larger than that for the hollow configuration. The overlap population diagrams elucidated that the prepeak is mainly composed of the O-Cu antibonding interactions, and the larger prepeak of the on-top configuration originates from the larger O-Cu interactions. The dependence of OK ELNES on the direction of the momentum transfer vector was also discussed. Knowledge of the responsible direction of the momentum transfer vector in relation to the interface orientation was concluded to be indispensable in order to discuss detailed profiles of the ELNES from metal/ceramic heterointerfaces. This study reveals the effect of the atomic configuration of the interface to the chemical bondings, interface strength, and ELNES.

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  • Received 11 January 2006

DOI:https://doi.org/10.1103/PhysRevB.74.235408

©2006 American Physical Society

Authors & Affiliations

Teruyasu Mizoguchi1,*, Takeo Sasaki1, Shingo Tanaka2, Katsuyuki Matsunaga1,†, Takahisa Yamamoto3, Masanori Kohyama2, and Yuichi Ikuhara1

  • 1Institute of Engineering Innovation, The University of Tokyo, Yayoi, Bunkyo, Tokyo 113-8656, Japan
  • 2Research Institute for Ubiquitous Energy Devices, National Institute of Advanced Industrial Science and Technology, 1-8-31 Midorigaoka, Ikeda 563-8577, Japan
  • 3Department of Advanced Materials Science, The University of Tokyo, 5-1-5, Kashiwanoha, Kashiwa, Chiba 277-8561, Japan

  • *Corresponding author. Email address: mizoguchi@sigma.t.u-tokyo.ac.jp
  • Present address: Department of Materials Science & Engineering, Kyoto University, Yoshida, Sakyo, Kyoto 606-8501, Japan.

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Issue

Vol. 74, Iss. 23 — 15 December 2006

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