Origin of triangular island shape and double-step bunching during GaN growth by molecular-beam epitaxy under excess Ga conditions

M. H. Xie, M. Gong, E. K. Y. Pang, H. S. Wu, and S. Y. Tong
Phys. Rev. B 74, 085314 – Published 22 August 2006

Abstract

GaN homoepitaxial growth by molecular-beam epitaxy under both excess gallium (Ga) and excess nitrogen (N) conditions is investigated. Based on two-dimensional island shape and surface step structures, we suggest the growth is kinetic-limited under the excess-Ga condition but diffusion-limited in the excess-N regime. The triangular GaN islands and double step bunching seen on surfaces prepared under excess-Ga are attributed to a difference in adatom attachment and/or site exchange rates between A and B steps, which is induced by surfactant Ga adlayers on GaN(0001).

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  • Received 31 October 2005

DOI:https://doi.org/10.1103/PhysRevB.74.085314

©2006 American Physical Society

Authors & Affiliations

M. H. Xie1,*, M. Gong1, E. K. Y. Pang1, H. S. Wu1, and S. Y. Tong2

  • 1Physics Department and the Joint Laboratory on New Materials, The University of Hong Kong, Pokfulam Road, Hong Kong
  • 2Department of Physics and Materials Science, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong

  • *Email address: mhxie@hkusua.hku.hk

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Vol. 74, Iss. 8 — 15 August 2006

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