Out-of-well carrier screening in a strained InxGa1xN/GaN multiple quantum well structure

Fei Chen and A. N. Cartwright
Phys. Rev. B 68, 233304 – Published 9 December 2003
PDFExport Citation

Abstract

Steady state and time-resolved differential transmission spectroscopy in a strained InxGa1xN/GaN multiple quantum well structure embedded within a p-i-n structure has been studied to identify the dominant screening mechanisms and measure the carrier sweep-out time. The results are consistent with a long-range out-of-well carrier screening where the photoexcited carriers escape the wells and separate, creating a space-charge field that induces an increase of the in-well field and shifts the excitonic transition to lower energies. A redshift of excitonic resonance under photoexcitation suggests that the direction of in-well field is opposite to that in the barriers due to the piezoelectric polarization in this strained InxGa1xN well. Compared with GaAs multiple quantum wells, a long carrier sweep-out time of 650 ps was observed in this structure.

  • Received 10 June 2003

DOI:https://doi.org/10.1103/PhysRevB.68.233304

©2003 American Physical Society

Authors & Affiliations

Fei Chen and A. N. Cartwright

  • Department of Electrical Engineering, University at Buffalo, State University of New York, Buffalo, New York 14260, USA

References (Subscription Required)

Click to Expand
Issue

Vol. 68, Iss. 23 — 15 December 2003

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×