Structural and electronic properties of the Sn/Si(111)3×3R30° surface

G. Profeta, A. Continenza, L. Ottaviano, W. Mannstadt, and A. J. Freeman
Phys. Rev. B 62, 1556 – Published 15 July 2000
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Abstract

The structural and electronic properties of the Sn/Si(111)3×3 surface are determined by means of all-electron local density full-potential augmented plane wave thin film calculations. We find strong similarities with the more extensively studied isolectronic systems (Sn/Ge and Pb/Ge) as far as the relaxed structure and the electronic properties are concerned. In analogy with these systems, we find, within the local density approximation (LDA), two surface states weakly dispersed in the Brillouin zone which are responsible for the hexagonal patterns observed in scanning tunneling microscopy (STM) experiments. When our calculated results, including STM images, are compared with available structural data and STM images, we find that the LDA predictions well reproduce the electron distribution at the surface and the structural properties, leading to a complete description of this system at room temperature.

  • Received 21 December 1999

DOI:https://doi.org/10.1103/PhysRevB.62.1556

©2000 American Physical Society

Authors & Affiliations

G. Profeta, A. Continenza, and L. Ottaviano

  • Istituto Nazionale di Fisica della Materia (INFM), Dipartimento Fisica, Università degli Studi dell’Aquila, 67010 Coppito (L’Aquila), Italy

W. Mannstadt

  • Fachbereich Physik der Philipps-Universität Marburg Renthof 5, 35037 Marburg/Lahn, Germany

A. J. Freeman

  • Department of Physics and Astronomy and Materials Research Center, Northwestern University, Evanston, Illinois 60208

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Vol. 62, Iss. 3 — 15 July 2000

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