Structure and electronic properties of FeSi2

S. J. Clark, H. M. Al-Allak, S. Brand, and R. A. Abram
Phys. Rev. B 58, 10389 – Published 15 October 1998
PDFExport Citation

Abstract

The nature of the band gap in the semiconducting material βFeSi2 is still under some dispute. Although most experimental results indicate the band gap to be direct, ab initio work generally reports the material to be an indirect semiconductor with the direct transition a few tens of millielectron volts higher than the indirect gap. However, βFeSi2 is commonly grown epitaxially on a diamond-structure Si substrate, and as a consequence, the βFeSi2 unit cell is strained. Here we report the results of ab initio density-functional calculations, which we have performed on βFeSi2 where its lattice parameters are constrained according to the heteroepitaxial system βFeSi2(100)/Si(001). This forms two types of lattice matching: (A) βFeSi2[010]||Si110 and (B) βFeSi2[010]||Si001. We find that the βFeSi2 band gap is highly sensitive to its lattice parameters and therefore to the orientation at which the material is grown on silicon. We find that type A favors a more direct band gap, while type B has an indirect gap.

  • Received 13 May 1998

DOI:https://doi.org/10.1103/PhysRevB.58.10389

©1998 American Physical Society

Authors & Affiliations

S. J. Clark, H. M. Al-Allak, S. Brand, and R. A. Abram

  • Department of Physics, University of Durham, Science Laboratories, South Road, Durham DH1 3LE, United Kingdom

References (Subscription Required)

Click to Expand
Issue

Vol. 58, Iss. 16 — 15 October 1998

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×