STM study of C2H2 adsorption on Si(001)

L. Li, C. Tindall, O. Takaoka, Y. Hasegawa, and T. Sakurai
Phys. Rev. B 56, 4648 – Published 15 August 1997
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Abstract

We present here a scanning tunneling microscope study of the initial bonding structure and subsequent reaction mechanism of C2H2 with the Si(001) surface. Upon exposure of the sample at room temperature to 0.2 L of C2H2 (approximately 20% coverage) adsorption of the molecule on alternate dimer pairs is observed, leading to either a local 2×2 or c(2×4) structure. In the filled-state image, a local minimum is observed in the center of the reacted dimer pairs, while the unreacted dimer pairs maintain the normal bean-shaped contour of the clean surface. The molecule forms an overlayer with either local 2×2 or c(4×2) order, leading to a saturation coverage of 0.5 monolayers. Upon annealing the substrate at 775 K the surface becomes disordered and the steps are no longer visible. After further annealing at 875 K, SiC clusters are formed and the 2×1 structure is again seen between the clusters. For a starting coverage of 20%, annealing to higher temperatures around 1100 K leads to pinning of the step movement by the SiC clusters. For a starting coverage of 0.5 monolayer, annealing at 1100 K results in faceting of the surface. Further annealing at 1275 K creates anisotropic facets that are oriented along the [1¯10] direction with a typical aspect ratio of approximately 4 to 5. These facets act as nucleation sites for subsequent carbonization and SiC growth.

  • Received 11 November 1996

DOI:https://doi.org/10.1103/PhysRevB.56.4648

©1997 American Physical Society

Authors & Affiliations

L. Li, C. Tindall, O. Takaoka, Y. Hasegawa, and T. Sakurai

  • Institute for Materials Research, Sendai 980-77, Japan

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Issue

Vol. 56, Iss. 8 — 15 August 1997

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