Resonant-optical-second-harmonic generation from thin C60 films

Bert Koopmans, Anton Anema, Harry T. Jonkman, George A. Sawatzky, and Folkert van der Woude
Phys. Rev. B 48, 2759 – Published 15 July 1993
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Abstract

We studied the optical-second-harmonic generation from thin C60 films, using a combination of frequency-, rotational-, angular-, and film-thickness-dependent measurements. We present a method to resolve the phase of χ(2) by exploiting the interference between the C60 overlayer contribution and the anisotropic Si(111) substrate contributions. We find a strong and sharp resonance at 2ħω=3.60 eV. The linewidth is found to be surprisingly small as compared to linear ellipsometry and third-harmonic-generation experiments. The intensity as a function of film thickness agrees with a model considering interference effects between equal second-harmonic contributions from the inner C60/Si interface and the outer C60 surface. The possibility of nonlocal bulk contributions is discussed.

  • Received 22 July 1992

DOI:https://doi.org/10.1103/PhysRevB.48.2759

©1993 American Physical Society

Authors & Affiliations

Bert Koopmans, Anton Anema, Harry T. Jonkman, George A. Sawatzky, and Folkert van der Woude

  • Laboratory of Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

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Vol. 48, Iss. 4 — 15 July 1993

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