Abstract
Precipitation of neutral iron () in n-type silicon (Si) and the generation of iron-acceptor pairs controlled by diffusion of positively charged iron () in p-type Si are investigated by means of electron spin resonance (ESR). The temperature range in which the diffusion of is active is found to be lower than that of from isochronal annealing experiments. Analyses of isothermal annealing experiments at various temperatures show that the activation energies for diffusion of and are 0.80 and 0.68 eV, respectively.
- Received 3 March 1992
DOI:https://doi.org/10.1103/PhysRevB.46.1882
©1992 American Physical Society