Interface formation of semiconductors with high-Tc superconductors: Ge/La1.85Sr0.15CuO4

Y. Gao, T. J. Wagener, J. H. Weaver, and D. W. Capone, II
Phys. Rev. B 37, 515 – Published 1 January 1988
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Abstract

Inverse photoemission has been used to probe the microscopic evolution of the semiconductor/superconductor interface Ge/La1.85Sr0.15CuO4. We find little or no reaction until the Ge coverage reaches 1 Å and that the reaction is quickly saturated when the nominal coverage reaches Å6 Å. The reaction is characterized by the reduction of the Cu 3dO 2p antibonding electronic states straddling the Fermi level and the shift of La 4f and 5d empty-state features toward EF. Large apparent electron mean free paths deduced from the attenuation of La peaks suggest cluster and island formation in the Ge/La1.85Sr0.15CuO4 interface.

  • Received 16 September 1987

DOI:https://doi.org/10.1103/PhysRevB.37.515

©1988 American Physical Society

Authors & Affiliations

Y. Gao, T. J. Wagener, and J. H. Weaver

  • Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455

D. W. Capone, II

  • Materials Science Division, Building 223, Argonne National Laboratory, Argonne, Illinois 60439

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Vol. 37, Iss. 1 — 1 January 1988

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