Shallow and deep donors in direct-gap n-type AlxGa1xAs:Si grown by molecular-beam epitaxy

E. F. Schubert and K. Ploog
Phys. Rev. B 30, 7021 – Published 15 December 1984
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Abstract

Temperature-dependent Hall-effect measurements are reported and analyzed in detail for n-type AlxGa1xAs of composition 0x0.40 grown by molecular-beam epitaxy and highly doped with Si (NSi5×1017 cm3). A quantitative analysis using Fermi-Dirac statistics reveals for the composition range 0.20x0.40 the presence of a hydrogenlike shallow Si donor which interacts with the Γ valley and a deep Si donor related to the X valley. In contrast to previous results, the thermal activation energy of the deep donor, determined to be Edd=140±10 meV, does not change significantly with alloy composition. Only the ratio of shallow-to deep-donor concentration depends on composition. For x0.20, neither deep-donor nor persistent photoconductivity exists in n-type AlxGa1xAs:Si. For 0.20x0.40, however, the deep-donor concentration increases with x while simultaneously the shallow-donor concentration decreases. The proposed interaction of the deep donor with the X valley helps in understanding the persistent photoconductivity found in n-type AlxGa1xAs with 0.20x0.40.

  • Received 21 May 1984

DOI:https://doi.org/10.1103/PhysRevB.30.7021

©1984 American Physical Society

Authors & Affiliations

E. F. Schubert and K. Ploog

  • Max-Planck-Institut für Festkörperforschung, D-7000 Stuttgart 80, Federal Republic of Germany

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Issue

Vol. 30, Iss. 12 — 15 December 1984

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