Figure 1

Experimental setup: (a) detection of the top fluorescence emission of the beam; (b) configuration for the collection of the far field intensity; (c) details of the optical setup of panel (b); (d) sketch showing the position of the shock plane inside of the sample.Reuse & Permissions

Figure 2

(a)–(c) Near-field images of the fluorescence emission of the propagating beam at fixed laser power ($P=8$ mW) and two different particle concentrations, (a) $c_{{\mathrm{SiO}}_2}=0$, (c) $c_{{\mathrm{SiO}}_2}=0.03$ w/w; (b)–(d) corresponding intensity profiles of the far-field images of the transmitted field at the exit face of 1 mm thick cell.Reuse & Permissions

Figure 3

(a)–(b) Intensity profiles taken at three different $Z$ position in the images of Figs. 2a, 2b, 2c: dashed line corresponds to $Z=0.3$ mm, dot-dashed line to $Z=0.7$ mm, and the continuous line to $Z=1.0$ mm. (c) Exponential (quasilinear) decays of beam intensity calculated from images of Fig. 2a (dashed line) and Fig. 2c (dot-dashed line).Reuse & Permissions

Figure 4

Top panels: low power ($P=10$ mW) images of the fluorescence emission of the beam along $Z$ at different concentrations of silica spheres: (a) $c_{{\mathrm{SiO}}_2}=0$, (b) $c_{{\mathrm{SiO}}_2}=0.017$ w/w, (c) $c_{{\mathrm{SiO}}_2}=0.030$ w/w; bottom panels: corresponding images of the transmitted (in the $X$-$Y$ plane) intensity at the exit facet of 1 mm cell.Reuse & Permissions

Figure 5

The same of Fig. 4 at laser power $P=450$ mW.Reuse & Permissions

Figure 6

scattered dots are the calculated steepness along the $Z$ direction for three different powers. The solid lines are polynomial fit of the steepness curves to identify their maximum value, indicated by the arrows.Reuse & Permissions

Figure 7

(a) measured $Z_s$ vs $P$ for different $c_{{\mathrm{SiO}}_2}$; (b) power-disorder diagram from the propagation measurements: filled circles are the threshold power calculated from (a), dashed line is a boundary due to the experimental available observation window, and the dot-dashed line is the boundary as estimated by the theory.Reuse & Permissions

Figure 8

(a) Correlation curves calculated from the far-field measurements calculated for the ordered sample and for three different increasing values of $c_{{\mathrm{SiO}}_2}$; (b) power-disorder phase diagram as calculated from the transverse intensity correlation curves of (a).Reuse & Permissions

Figure 9

Images of the far-field intensity distribution of the transmitted beam after 1 mm propagation distance. The left panels group refers to ordered samples (i.e., fixed $c_{{\mathrm{SiO}}_2}=0$) at fixed power $P=140$ mW at various dye concentrations (a) $c_{\mathrm{RhB}}=0.05$ mM, (b) $0.1$ mM, and (c) $0.2$ mM. The right panels group shows the far field intensity profile in disordered samples (i.e., fixed $c_{\mathrm{RhB}}=0.1$ mM) fixed laser power $P=130$ mW and at various SiO${}_2$ concentrations (a’) $c_{{\mathrm{SiO}}_2}=0.005$ w/w, (b’) $0.017$ w/w, and (c’) $0.038$ w/w.Reuse & Permissions

Figure 10

(a)–(f): spectral content of the transmitted beam of the ordered samples ($c_{{\mathrm{SiO}}_2}=0$) at two laser power $P$ and different dye concentration: (a), (d) $c_{\mathrm{RhB}}=0.05$ mM; (b), (e) $0.1$ mM; and (c), (f) $0.2$ mM. Bottom panels: $\theta$ vs $P$ curves (g); threshold power $P$ as calculated from curves of (g) vs $c_{\mathrm{RhB}}$ (h).Reuse & Permissions

Figure 11

(a)–(f): low dye concentration ($c_{\mathrm{RhB}}=0.05$ mM) spectral content of the transmitted beam by disordered samples at two different laser power $P$ and different SiO${}_2$ concentration: (a), (d) $c_{{\mathrm{SiO}}_2}=0.007$ w/w; (b), (e) $0.018$ w/w; and (c), (f) $0.038$ w/w; (g) the angular aperture $\theta$ vs $P$: the curves show no threshold behavior in the presence of disorder.Reuse & Permissions

Figure 12

(a)–(f) are the same as Fig. 11 but at higher dye concentration ($c_{\mathrm{RhB}}=0.1$ mM); (g) the angular aperture $\theta$ vs $P$: at this higher dye concentration the curves have recovered the threshold behavior also in the presence of disorder; (h) power-disorder phase diagram from the curves of (g).Reuse & Permissions