Implementation schemes for unsharp measurements with trapped ions

Sujit K. Choudhary, T. Konrad, and H. Uys
Phys. Rev. A 87, 012131 – Published 31 January 2013

Abstract

Unsharp positive operator-valued measurements allow a variety of measurement applications which minimally disrupt the state of the quantum system. Experimental schemes are proposed for implementing unsharp measurements on the qubit levels of a trapped ion. The schemes rely on introducing weak entanglement between the state of a target ion and that of an auxiliary ion, using standard ion-trap quantum logic operations, and then realizing an unsharp measurement through projective measurement on the auxiliary atom. We analyze common sources of error and their effect on different applications of unsharp measurements.

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  • Received 9 November 2012

DOI:https://doi.org/10.1103/PhysRevA.87.012131

©2013 American Physical Society

Authors & Affiliations

Sujit K. Choudhary1,*, T. Konrad1,2,†, and H. Uys3,‡

  • 1School of Chemistry and Physics, University of KwaZulu-Natal, Durban 4001, South Africa
  • 2National Institute of Theoretical Physics, University of KwaZulu-Natal, Durban 4001, South Africa
  • 3National Laser Centre, Council for Scientific and Industrial Research, Pretoria 0001, South Africa

  • *choudhary@ukzn.ac.za
  • konradt@ukzn.ac.za
  • huys@csir.co.za

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Vol. 87, Iss. 1 — January 2013

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