Thin liquid films on rough or heterogeneous solids

Mark O. Robbins, David Andelman, and Jean-François Joanny
Phys. Rev. A 43, 4344 – Published 1 April 1991
PDFExport Citation

Abstract

We study the conformation of thin liquid films on rough or heterogeneous solid substrates. The liquid-substrate interaction dominates for sufficiently thin films, and heterogeneity roughens the liquid interface. As the film thickens, surface tension becomes increasingly important, and the liquid interface flattens. A general equation for the equilibrium interface shape is derived. Analytic results are obtained in the limit of weak disorder for rough or self-affine surfaces as well as chemically heterogeneous solids. The effect of disorder depends strongly on the wave vector. Fluctuations at scales smaller than the film thickness or a ‘‘healing length’’ ξ produce little roughness. At larger wavelengths, the film conforms to the local fluctuations. Exact numerical solutions of the general equation are presented for surfaces with square grooves. These confirm the qualitative predictions of the analytic theory, and are in quantitative agreement when the depth of the grooves is small. The variation of roughness with film thickness, as well as the calculated adsorption isotherms, are compared to recent experimental results. We show that previously measured isotherms can be reproduced by corrugated surfaces with a single characteristic length scale, and do not necessarily imply that the surfaces studied were self-similar.

  • Received 1 October 1990

DOI:https://doi.org/10.1103/PhysRevA.43.4344

©1991 American Physical Society

Authors & Affiliations

Mark O. Robbins

  • Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218
  • Institute for Theoretical Physics, University of California, Santa Barbara, California 93106

David Andelman

  • Institute for Theoretical Physics, University of California, Santa Barbara, California 93106
  • School of Physics and Astronomy, Raymond and Beverly Sackler Faculty of Exact Sciences, Tel Aviv University, Ramat Aviv 69978, Tel Aviv, Israel

Jean-François Joanny

  • Institut Charles Sadron, 6 rue Boussingault, 67083 Strasbourg CEDEX, France

References (Subscription Required)

Click to Expand
Issue

Vol. 43, Iss. 8 — April 1991

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×