Synchrotron studies of the first-order melting transitions of hexatic monolayers and multilayers in freely suspended liquid-crystal films

S. Amador, P. S. Pershan, H. Stragier, B. D. Swanson, D. J. Tweet, L. B. Sorensen, E. B. Sirota, G. E. Ice, and A. Habenschuss
Phys. Rev. A 39, 2703 – Published 1 March 1989
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Abstract

Synchrotron x-ray diffraction has been used to study the surface and the interior hexatic-to-liquid (smectic-I to smectic-C) melting transitions of freely suspended liquid-crystal films of N-[4-(n-heptyl)benzylidene]-4-(n-heptyl)aniline (7O.7) five molecular layers thick. Both the surface hexatic monolayers and the interior hexatic layers melt via hysteretic first-order transitions. After the two surface layers undergo a first-order transition to the smectic-I phase, the surface hexatic correlation length ξ evolves smoothly from 100 to 300 Å with a roughly square-root form, ξ∼‖T-Tc1/2.

  • Received 26 September 1988

DOI:https://doi.org/10.1103/PhysRevA.39.2703

©1989 American Physical Society

Authors & Affiliations

S. Amador and P. S. Pershan

  • Division of Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138

H. Stragier, B. D. Swanson, D. J. Tweet, and L. B. Sorensen

  • Department of Physics, FM-15, University of Washington, Seattle, Washington 98195

E. B. Sirota

  • Exxon Research and Engineering Co., Corporate Research Science Laboratories, Route 22 East, Annandale, New Jersey 08801

G. E. Ice

  • Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831

A. Habenschuss

  • Chemistry Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831

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Vol. 39, Iss. 5 — March 1989

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