Capillary waves on the surface of simple liquids measured by x-ray reflectivity

A. Braslau; P. S. Pershan; G. Swislow; B. M. Ocko; J. Als-Nielsen

doi:10.1103/PhysRevA.38.2457

Capillary waves on the surface of simple liquids measured by x-ray reflectivity

A. Braslau, P. S. Pershan, G. Swislow, B. M. Ocko, and J. Als-Nielsen

Phys. Rev. A 38, 2457 – Published 1 September 1988

Abstract

The properties of the liquid-vapor interface for three simple liquids (water, carbon tetrachloride, and methanol) have been measured using x-ray reflectivity. The measured surface roughness is interpreted using a model that combines the effects of thermally induced capillary waves and the dimensions of the constituent molecules.

Received 25 January 1988

DOI:https://doi.org/10.1103/PhysRevA.38.2457

Authors & Affiliations

A. Braslau, P. S. Pershan, and G. Swislow

Department of Physics and Division of Applied Sciences, Harvard University, Cambridge, Massachusetts 02138

B. M. Ocko

Department of Physics, Brookhaven National Laboratory, Upton, New York 11973
Department of Physics and Division of Applied Sciences, Harvard University, Cambridge, Massachusetts 02138

J. Als-Nielsen

Riso/ National Laboratory, DK-4000 Roskilde, Denmark

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Vol. 38, Iss. 5 — September 1988

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