Pressure-Induced Phonon Frequency Shifts Measured by Raman Scattering

S. S. Mitra; O. Brafman; W. B. Daniels; R. K. Crawford

doi:10.1103/PhysRev.186.942

Pressure-Induced Phonon Frequency Shifts Measured by Raman Scattering

S. S. Mitra, O. Brafman, W. B. Daniels, and R. K. Crawford

Phys. Rev. 186, 942 – Published 15 October 1969

Abstract

Pressure shifts of long-wavelength LO and TO phonons of a number of diamond-, zinc-blende-, and wurtzite-type crystals as functions of hydrostatic pressure have been investigated by Raman-scattering measurements. The measured Grüneisen parameters appear to correlate with ionicity. The $E_{2}$ modes of CdS and ZnO have also been studied.

Received 8 April 1969

DOI:https://doi.org/10.1103/PhysRev.186.942

Authors & Affiliations

S. S. Mitra and O. Brafman^*,†

Department of Electrical Engineering, University of Rhode Island, Kingston, Rhode Island 02881

W. B. Daniels and R. K. Crawford^‡

Solid State and Materials Laboratory, Princeton University, Princeton, New Jersey 08540

^*Present address: Physics Department, Technion, Haifa, Israel.
^†Research supported in part by the U. S. Air Force In-House Laboratory Independent Research Fund under Contract No. AF 19(628)-6042. An equipment grant from the Advanced Research Projects Agency, Grant No. DA-ARO-D-31-124-G754, is gratefully acknowledged.
^‡Research supported by the National Science Foundation under Grant No. GP-7739.

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Vol. 186, Iss. 3 — October 1969

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