Interplay between Static and Dynamic Properties of Semifluxons in YBa2Cu3O7δ 0π Josephson Junctions

K. Cedergren, J. R. Kirtley, T. Bauch, G. Rotoli, A. Troeman, H. Hilgenkamp, F. Tafuri, and F. Lombardi
Phys. Rev. Lett. 104, 177003 – Published 28 April 2010

Abstract

We have investigated the static and dynamic properties of long YBa2Cu3O7δ 0π Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0π Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0π Josephson junctions.

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  • Received 18 November 2009

DOI:https://doi.org/10.1103/PhysRevLett.104.177003

©2010 American Physical Society

Authors & Affiliations

K. Cedergren1, J. R. Kirtley2, T. Bauch1, G. Rotoli3, A. Troeman4, H. Hilgenkamp4, F. Tafuri5, and F. Lombardi1

  • 1Quantum Device Physics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-412 96 Göteborg, Sweden
  • 2Center for Probing the Nanoscale, Stanford University, Stanford, California 94304, USA
  • 3CNISM and DIMEG, Università di L’Aquila, Località Monteluco, 67040 L’Aquila, Italy
  • 4Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, Post Office Box 217, 7500 AE Enschede, The Netherlands
  • 5Dipartimento Ingegneria dell’Informazione, Seconda Università di Napoli e CNR-SPIN, Aversa (CE), Italy

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Vol. 104, Iss. 17 — 30 April 2010

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