Abstract
We have investigated the static and dynamic properties of long Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of Josephson junctions.
- Received 18 November 2009
DOI:https://doi.org/10.1103/PhysRevLett.104.177003
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