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Barrier properties in YBa2Cu3O7x grain-boundary Josephson junctions using electron-beam irradiation

F. Tafuri, B. Nadgorny, S. Shokhor, M. Gurvitch, F. Lombardi, F. Carillo, A. Di Chiara, and E. Sarnelli
Phys. Rev. B 57, R14076(R) – Published 1 June 1998
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Abstract

Electron-beam irradiation has been used to induce controllable variations in the properties of YBa2Cu3O7x biepitaxial grain-boundary Josephson junctions. A correlation between the transport properties and the microstructure was obtained by determining the ratio of a barrier thickness to the dielectric constant of the junctions with different barriers. These results give evidence of the role of the oxygen content and the dielectric constant of the interface region in transport phenomena. The experiment also demonstrates frequency tunability in a resonant soliton oscillator.

  • Received 19 March 1998

DOI:https://doi.org/10.1103/PhysRevB.57.R14076

©1998 American Physical Society

Authors & Affiliations

F. Tafuri

  • Dipartimento di Ingegneria dell’ Informazione, Seconda Universitá di Napoli, Aversa (CE), Italy
  • INFM, Dipartimento di Scienze Fisiche, Universitá di Napoli “Federico II,” Napoli, Italy

B. Nadgorny*, S. Shokhor, and M. Gurvitch

  • Department of Physics, State University of New York at Stony Brook, Stony Brook, New York 11794

F. Lombardi, F. Carillo, and A. Di Chiara

  • INFM, Dipartimento di Scienze Fisiche, Universitá di Napoli “Federico II,” Napoli, Italy

E. Sarnelli

  • Instituto di Cibernetica del CNR, Via Toiano 6 I-80072, Arco Felice (NA), Italy

  • *Present address: Naval Research Laboratory, Washington, D.C. 20375.

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Vol. 57, Iss. 22 — 1 June 1998

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