Structural and electronic properties of strained Si/GaAs heterostructures

M. Peressi, L. Colombo, R. Resta, S. Baroni, and A. Baldereschi
Phys. Rev. B 48, 12047 – Published 15 October 1993
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Abstract

Band offsets at lattice-mismatched heterojunctions can be tuned owing to their dependence on macroscopic strain, and hence on the substrate composition. The system studied here, GaAs/Si(001), is lattice mismatched and heterovalent, offering thus an additional flexibility, due to the intrinsic nonbulk character of the band offset at heterovalent junctions. Starting with a study of macroscopic and microscopic elasticity, we evaluate the band offset for several fully relaxed inequivalent interfaces. Both macroscopic strain and microscopic morphology strongly affect the offset between the topmost Si and GaAs valence bands, which, consequently, is tunable, in principle, by as much as 1.1 eV.

  • Received 7 June 1993

DOI:https://doi.org/10.1103/PhysRevB.48.12047

©1993 American Physical Society

Authors & Affiliations

M. Peressi

  • Dipartimento di Fisica Teorica dell’Università di Trieste, Strada Costiera 11, I-34014 Trieste, Italy

L. Colombo

  • Dipartimento di Fisica dell’Università di Milano, Via Celoria 16, I-20133 Milano, Italy

R. Resta and S. Baroni

  • Scuola Internazionale Superiore di Studî Avanzati (SISSA), Via Beirut 2/4, I-34014 Trieste, Italy

A. Baldereschi

  • Dipartimento di Fisica Teorica dell’Università di Trieste, Strada Costiera 11, I-34014 Trieste, Italy
  • Institut Romand de Recherche Numérique en Physique des Materiaux (IRRMA), Ecole Polytechnique Fédérale,
  • PHB-Ecublens, CH-1015 Lausanne, Switzerland

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Issue

Vol. 48, Iss. 16 — 15 October 1993

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