IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2007)
Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
Tetsuya ITOShigeru SAWADAYasuhiro HATTORIYasushi SAITOHTerutaka TAMAIKazuo IIDA
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2008 Volume E91.C Issue 8 Pages 1199-1205

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Abstract

In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.

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© 2008 The Institute of Electronics, Information and Communication Engineers
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