Anode current saturation of ALD-coated Planacon® MCP-PMTs

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Published 3 September 2018 • © 2018 IOP Publishing Ltd and Sissa Medialab
, , Citation E.V. Antamanova et al 2018 JINST 13 T09001 DOI 10.1088/1748-0221/13/09/T09001

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Author affiliations

1 National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, Moscow, 115409, Russia

2 Niels Bohr Institute, University of Copenhagen, NØrregade 10, 1017 Copenhagen, Denmark

3 Chicago State University, 9501 S. King Drive, Chicago, IL 60628, United States

4 Institute for Nuclear Research of the Russian Academy of Sciences, V-312, 60-letiya Oktyabrya prospect 7a, Moscow, 117312, Russia

5 California Polytechnic State University, 1 Grand Avenue, San Luis Obispo, CA 93407, United States

6 University of Jyväskylä, P.O. Box 35, FI-40351 Jyväskylä, Finland

Dates

  1. Received 26 July 2018
  2. Accepted 21 August 2018
  3. Published

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1748-0221/13/09/T09001

Abstract

We have measured and compared the characteristics of ALD-coated Planacon® MCP-PMTs (XP85112/A1-Q-L) with their non-ALD counterparts (XP85012/A1-Q). While the latter show excellent performance, the ALD-coated sensors have surprisingly low current saturation levels (∼ two orders of magnitude lower than expected) and extremely high gain recovery time (more than 7 orders of magnitude higher than expected). We suspect that these problems might be caused by the unexpected side-effects of the ALD process. To make a definite conclusion, more samples need to be tested, preferably from different production runs. If our observation were confirmed, it would mean a serious technological setback for ALD-coated MCP-PMTs.

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