Abstract
Lens-coupled X-ray in-direct imaging detectors are very popular for high-resolution X-ray imaging at the third generation synchrotron radiation facilities. This imaging system consists of a scintilator producing a visible-light image of X-ray beam, a microscope objective, a mirror reflecting at 90° and a CCD camera. When the thickness of the scintillator is matched with the numerical aperture (NA) of the microscope objective, the image quality of experimental results will be improved obviously. This paper used an imaging system at BL13W beamline of Shanghai Synchrotron Radiation Facility (SSRF) to study the matching relation between the scintillator thickness and the NA of the microscope objective with a real sample. By use of the matching relation between the scintillator thickness and the NA of the microscope objective, the optimal imaging results have been obtained.