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Structural characterization of Mg-doped C60 thin films

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Published under licence by IOP Publishing Ltd
, , Citation N Kojima et al 2009 J. Phys.: Conf. Ser. 159 012018 DOI 10.1088/1742-6596/159/1/012018

1742-6596/159/1/012018

Abstract

The epitaxial growth of Mg-doped C60 films has been investigated. It is found that the epitaxial growth of Mg-doped C60 film is enabled by using mica (001) substrate in the low Mg concentration region (Mg/C60 molar ratio < 1). The crystal quality of the epitaxial Mg-doped C60 film is improved drastically in compared with micro-crystalline film on glass substrate. Such drastic improvement of crystal quality in the epitaxial films results significant increase in conductivity. This result may indicate the significant increase of carrier mobility. In addition, the crystal structure change is observed in high Mg concentration region (Mg/C60 molar ratio > 2). The C60 polymer sheet formation is suggested.

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10.1088/1742-6596/159/1/012018