GaAs-based long-wavelength InAs bilayer quantum dots grown by molecular beam epitaxy

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2011 Chinese Institute of Electronics
, , Citation Zhu Yan et al 2011 J. Semicond. 32 083001 DOI 10.1088/1674-4926/32/8/083001

1674-4926/32/8/083001

Abstract

Molecular beam epitaxy growth of a bilayer stacked InAs/GaAs quantum dot structure on a pure GaAs matrix has been systemically investigated. The influence of growth temperature and the InAs deposition of both layers on the optical properties and morphologies of the bilayer quantum dot (BQD) structures is discussed. By optimizing the growth parameters, InAs BQD emission at 1.436 μm at room temperature with a narrower FWHM of 27 meV was demonstrated. The density of QDs in the second layer is around 9 × 109 to 1.4 × 1010 cm−2. The BQD structure provides a useful way to extend the emission wavelength of GaAs-based material for quantum functional devices.

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10.1088/1674-4926/32/8/083001