Computer-assisted Hall effect measurements as a function of temperature

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Published under licence by IOP Publishing Ltd
, , Citation A Parisini and R Reverberi 1989 Eur. J. Phys. 10 281 DOI 10.1088/0143-0807/10/4/007

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1 Dept. of Phys., Parma Univ., Italy

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0143-0807/10/4/281

Abstract

The authors have designed a facility for Hall effect measurements, automated by a commercial microcomputer. The van der Pauw method has been employed. The system was designed for the characterisation of the electrical properties of semiconductors as a function of temperature. This project is proposed as a short laboratory course for physics students.

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