Improved accuracy for dielectric data

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, , Citation D E Palaith and S K Chang 1983 J. Phys. E: Sci. Instrum. 16 227 DOI 10.1088/0022-3735/16/3/014

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1 Schlumberger-Doll Res., Ridgefield, CT, USA

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Abstract

The authors present a substantially improved method of deriving complex electrical permittivities from two-port scattering parameter measurements. The method results in the minimum propagation of measurement errors, thereby establishing a lower bound for errors in the permittivity. Analysis of data from medium and high loss materials is presented as a demonstration of the ideas presented.

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