The influence of melt purification and structure defects on mid-infrared light emitting diodes

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Published 18 June 2003 Published under licence by IOP Publishing Ltd
, , Citation A Krier and V V Sherstnev 2003 J. Phys. D: Appl. Phys. 36 1484 DOI 10.1088/0022-3727/36/13/309

0022-3727/36/13/1484

Abstract

Mid-infrared light emitting diodes which exhibit more than 7 mW (pulsed) and 0.35 mW dc output power at 3.3 μm and at room temperature have been fabricated by liquid phase epitaxy using Pb as a neutral solvent. Using Pb solution an increase in pulsed output power of between two and three times was obtained compared with InAs light emitting diodes (LEDs) made using rare-earth gettering. The performance improvements were attributed to a reduction in residual carrier concentration arising from the removal of un-intentional donors and structure defects in the InAs active region material. These LEDs are well matched to the CH4 absorption spectrum and potentially could form the basis of a practical infrared CH4 gas sensor.

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10.1088/0022-3727/36/13/309