Optical retardation measurements were performed on rubbed polyimide-coated substrates used for liquid-crystal cells. Based on measurements with and without a refractive index matching fluid, the retardation component due to the rub-induced scratches was extracted, and found to dominate the total retardation at higher rubbing strengths. Additionally, atomic force microscope measurements were performed to examine the rub-induced surface topography. The retardation calculated from the topography measurements was found to be in agreement with the optical results.
REFERENCES
1.
2.
3.
J. M.
Geary
, J. W.
Goodby
, A. R.
Kmetz
, and J. S.
Patel
, J. Appl. Phys.
62
, 4100
(1987
).4.
E. S.
Lee
, Y.
Saito
, and T.
Uchida
, Jpn. J. Appl. Phys., Part 2
32
, L1822
(1993
).5.
Y. M.
Zhu
, L.
Wang
, Z. H.
Lu
, Y.
Wei
, X. X.
Chen
, and J. H.
Tang
, Appl. Phys. Lett.
65
, 49
(1994
).6.
Y. B.
Kim
, H.
Olin
, S. Y.
Park
, J. W.
Choi
, L.
Komitov
, M.
Matsuszczyk
, and S. T.
Lagerwall
, Appl. Phys. Lett.
66
, 2218
(1995
).7.
A. J.
Pidduck
, G. P.
Bryan-Brown
, S. D.
Haslam
, and R.
Bannister
, Liq. Cryst.
21
, 759
(1996
).8.
A. J.
Pidduck
, G. P.
Bryan-Brown
, S. D.
Haslam
, R.
Bannister
, I.
Kitely
, T. J.
McMaster
, and L.
Boogaard
, J. Vac. Sci. Technol. A
14
, 1723
(1996
).9.
J. Y.
Huang
, J. S.
Li
, Y. S.
Juang
, and S. H.
Chen
, Jpn. J. Appl. Phys., Part 1
34
, 3163
(1995
).10.
H.-M.
Wu
, J. H.
Tang
, Q.
Luo
, Z. M.
Sun
, Y.-M.
Zhu
, Z. H.
Lu
, and Y.
Wei
, Appl. Phys. B: Lasers Opt.
62
, 613
(1996
).11.
M. F.
Toney
, T. P.
Russel
, J. A.
Logan
, H.
Kikuchi
, J. M.
Sands
, and S. K.
Kumar
, Nature (London)
374
, 709
(1995
).12.
X.
Zhuang
, D.
Wilk
, L.
Marrucci
, and Y. R.
Shen
, Phys. Rev. Lett.
75
, 2144
(1995
).13.
14.
N. A. J. M.
van Aerle
, M.
Barmentlo
, and R. W.
Hollering
, J. Appl. Phys.
74
, 3111
(1993
).15.
E. S.
Lee
, P.
Vetter
, T.
Miyashita
, and T.
Uchida
, Jpn. J. Appl. Phys., Part 2
32
, L1399
(1993
).16.
C.
Rosenblatt
, F. F.
Torres De Araujo
, and R. B.
Frankel
, Biophys. J.
40
, 83
(1982
).17.
L. H.
Cescato
, E.
Gluch
, and N.
Streibl
, Appl. Opt.
29
, 3288
(1990
).
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