Strain, deformation, and temperature measurements constitute some of the most interesting parameters to be monitored in composite materials or structures. White light interferometry offers good performance even for long-term measurements of these parameters. Based on the Michelson interferometer, a fiberoptic localized extensometer and multiplexing strain-sensing techniques are demonstrated in this article. Related problems such as the effect of optical fiber coating on an embedded sensor and the dual use of one sensor are discussed. Finally, application examples of surface strain and internal strain (0–6000 microstrain) and temperature (22–36 °C) of concrete sample are given.
REFERENCES
1.
2.
3.
K.
Kim
, L.
Kollar
, and G.
Springer
, J. Compos. Mater.
27
, 1618
(1993
).4.
5.
J.
Sirkis
and H.
Haslach
, J. Intell. Mater. Syst. Struct.
2
, 3
(1991
).6.
L. P.
Kollar
and R. J. Van
Steenkiste
, J. Compos. Mater.
32
, 1647
(1998
).7.
8.
9.
10.
11.
12.
G.
Carman
, R.
Averill
, K.
Reifsnider
, and J.
Reddy
, J. Compos. Mater.
27
, 589
(1992
).13.
14.
G.
Carman
and K.
Reifsnider
, J. Intell. Mater. Syst. Struct.
4
, 88
(1993
).15.
R. J.
Van Steenkiste
and L. P.
Kollar
, J. Compos. Mater.
32
, 1681
(1998
).16.
17.
L. B. Yuan and L. M. Zhou, Proceeding of the International Workshop on Fracture Mechanics and Advanced Engineering Materials. Australia, December 8–10, 1999.
18.
T.
Li
, A.
Wang
, K.
Murphy
, and R.
Claus
, Opt. Lett.
20
, 785
(1995
).19.
D.
Inaudi
, S.
Vurpillot
, and S.
Lloret
, Proc. SPIE
2718
, 251
(1996
).20.
21.
22.
23.
D. A. Pinnow, “ELASTOOPTICAL MATERIALS,” in Handbook of Lasers, edited by R. J. Pressley (CRC, Cleveland, 1971).
24.
L. B. Yuan and L. M. Zhou, Rev. Sci. Instrum. (submitted).
25.
F.
Farahi
, T. P.
Newson
, J. D. C.
Jones
, and D. A.
Jackson
, Opt. Commun.
65
, 319
(1988
).26.
V. Gusmeroli, M. Martinelli, A. Barberis, and Mariottini, Proceedings of the 9th International Conference on Optical Fiber Sensors, Florence, Italy, 1993, p. 71.
27.
28.
29.
30.
31.
32.
33.
This content is only available via PDF.
© 2000 American Institute of Physics.
2000
American Institute of Physics
You do not currently have access to this content.
