Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

High resolution AC temperature field imaging

High resolution AC temperature field imaging

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Add to cart
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)
Add to cart

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

© IEE
Published

Using a CCD camera and a multichannel lock-in scheme, the authors have enhanced the capabilities of photoreflectance microscopy to obtain a 2D image without scanning the sample, thus dramatically reducing the acquisition time. The photoreflectance images presented show Joule and Peltier heating of a polycrystalline Si 1 kΩ resistor across which a 30 mA peak to peak sinusoidal current is forced.

Inspec keywords: integrated circuit testing; Peltier effect; photoreflectance; temperature distribution; thermal analysis; microscopy; temperature measurement

Other keywords: polycrystalline Si resistor; photoreflectance microscopy; Joule heating; high resolution imaging; multichannel lock-in detection scheme; acquisition time reduction; active microstructures; Si; LED source; active ICs; Peltier heating; AC temperature field imaging; CCD camera; 2D image

Subjects: Measurement; Thermal variables measurement; Testing; Manufacturing processes; Production facilities and engineering

References

    1. 1)
      • P. Gleyzes , F. Guernet , A.C. Boccara . Profilométrie picométrique. ii.l'approche multi-détecteur et la détection synchrone multiplexée. J. Opt. (Paris) , 6 , 251 - 265
    2. 2)
      • J. Opsal , A. Rosencwaig , D.L. Wilenborg . Thermal-wave detection of thin film thickness measurements with laserbeam deflection. Appl. Opt. , 20 , 3169 - 3176
    3. 3)
      • A.M. Mansanares , J.P. Roger , D. Fournier , A.C. Boccara . Temperature field determination of InGaAsP/InP lasers by photothermalmicroscopy:Evidence for weak nonradiative processes at the facets. Appl. Phys. Lett. , 1 , 4 - 6
    4. 4)
      • K. Plamann , D. Fournier , B.C. Forget , A.C. Boccara . Microscopic measurement of the local heat conduction in polycrystallinediamond films. Diam. Rel. Mater. , 699 - 705
    5. 5)
      • Boccara, A.C., Charbonnier, F., Fournier, D., Gleyzes, P.: `Method and device for multichannel analog detection', France, FR 90.08255, 1990, and international extensions.
    6. 6)
      • B.C. Forget , I. Barbereau , D. Fournier , S. Tuli , A.B. Bhattacharyya . Electronic diffusivity measurement in silicon by photothermal microscopy. Appl. Phys. Lett. , 8 , 1107 - 1109
    7. 7)
      • W. Claeys , S. Dilhaire , V. Quintard , D. Lewis , T. Phan , J.L. Aucouturier . Interferences of peltier thermal waves produced in ohmic contactsupon integrated circuits. J. Phys IV , 195 - 198
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19971133
Loading

Related content

content/journals/10.1049/el_19971133
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
Print this page
This is a required field
Please enter a valid email address