Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Linear imaging in scanning polarisation/interference contrast microscopy

Linear imaging in scanning polarisation/interference contrast microscopy

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

The theory and design of a linear polarisation/interference contrast microscope are described. The operation of the technique is based on the use of a sinusoidally driven electro-optic phase modulator. The expected sensitivity of the system in detecting phase variations is 5 × 10-7 rad, in a 10Hz bandwidth. Experimental results are presented on the imaging of magnetic domains, which clearly demonstrate the sensitivity superiority of linear operation.

References

    1. 1)
      • C.W. See , M. Vaez Iravani , H.K. Wickramasinghe . Scanning differential phase contrast optical microscope—application to surface studies. Appl. Opt. , 2373 - 2379
    2. 2)
      • L. Laub . AC heterodyne profilometer. J. Opt. Soc. Am.
    3. 3)
      • D.L. Lessor , J.S. Hartman , R.L. Gordon . Quantitative surface topography determination by Normarski reflection microscopy: I theory. J. Opt. Soc. Am. , 357 - 366
    4. 4)
      • M. Vaez Iravani . Fibre-optic scanning differential interference contrast optical microscope. Electron. Lett. , 103 - 105
    5. 5)
      • G. Nomarski , A.R. Weill . Application à la métallographie des méthodes interférentielles à deux ondes polarisées. Rev. Metallurgie , 121 - 134
    6. 6)
      • C.C. Huang . Optical phase profilometer. Opt. Eng. , 365 - 370
    7. 7)
      • E. Hecht , A. Zajac . (1979) , Optics.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19860740
Loading

Related content

content/journals/10.1049/el_19860740
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address