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Simple material parameter estimation via terahertz time-domain spectroscopy

Simple material parameter estimation via terahertz time-domain spectroscopy

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A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 µm at a frequency of 0.1 THz or 20 µm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.

Inspec keywords: parameter estimation; submillimetre wave spectroscopy; dielectric materials; dielectric measurement; time-domain analysis; nondestructive testing

Other keywords: fixed-point iteration; high-resistivity silicon; material parameter estimation; terahertz time-domain spectroscopy; 1.0 THz; 0.1 THz; dielectric parameters

Subjects: Materials testing; Dielectric variables measurement; Electrical instruments and techniques; Optical spectroscopy and spectrometers; Dielectric materials and properties; Nondestructive testing: other techniques; Measurement of basic electric and magnetic variables

References

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      • L. Duvillaret , F. Garet , J.-L. Coutaz . A reliable method for extraction of material parameters in terahertztime-domain spectroscopy. IEEE J. Sel. Top. Quantum Electron. , 3 , 739 - 746
    2. 2)
      • T.D. Dorney , R.G. Baraniuk , D.M. Mittleman . Material parameter estimation with terahertz time-domain spectroscopy. J. Opt. Soc. Am. A , 7 , 1562 - 1571
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    4. 4)
      • M.N. Afsar , K.J. Button . Precise millimeter-wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of GaAs, Si, SiO2, Al2O3, BeO, Macor, and Glass. IEEE Trans. Microw. Theory Tech. , 2 , 217 - 223
    5. 5)
      • L. Duvillaret , F. Garet , J.L. Coutaz . Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy. Appl. Opt. , 2 , 409 - 415
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