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Characterisation of dual gate lateral inversion layer emitter transistor

Characterisation of dual gate lateral inversion layer emitter transistor

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Proceedings of International Conference on Power Electronics Machines and Drives — Recommend this title to your library

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Inspec keywords: losses; power transistors; power semiconductor switches; minority carriers; driver circuits; power integrated circuits

Subjects: Power integrated circuits; Relays and switches; Power electronics, supply and supervisory circuits; Power semiconductor devices

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