Issue 8, 2011

Localization imaging using blinking quantum dots

Abstract

The blinking phenomena of the quantum dots have been utilized in the super-resolution localization microscopy to map out the locations of individual quantum dots on a total internal reflection microscope. Our result indicated that the reconstructed image of quantum dots agreed with the topographic image measured by atomic force microscopy. Because of the superior optical properties of the quantum dots, the high localization resolution can be achieved in the shorter acquisition time with larger detected photon numbers. When the cells were labeled with quantum dots, the sub-cellular structures could be clearly seen in the reconstructed images taken by a commercial microscope without using complicated optical systems, special photo-switchable dye pairs or photo-activated fluorescence proteins.

Graphical abstract: Localization imaging using blinking quantum dots

Article information

Article type
Paper
Submitted
03 Nov 2010
Accepted
08 Feb 2011
First published
28 Feb 2011

Analyst, 2011,136, 1608-1613

Localization imaging using blinking quantum dots

F. Chien, C. W. Kuo and P. Chen, Analyst, 2011, 136, 1608 DOI: 10.1039/C0AN00859A

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