Issue 9, 2010
From the journal:

Journal of Analytical Atomic Spectrometry

Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

Pawel Pohl,*ab   Nopparat Vorapalawut,ac   Brice Bouyssierea  and  Ryszard Lobinskiad  

* Corresponding authors

a CNRS/UPPA, Laboratoire de Chimie Analytique Bio-inorganique et Environnement, UMR 5254, Hélioparc, 2, Av. Pr. Angot, Pau, France

b Faculty of Chemistry, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, Wroclaw, Poland
E-mail: pawel.pohl@pwr.wroc.pl

c Faculty of Science, Mahidol University, Rama VI Rd., Rajthevee, Bangkok, Thailand

d Department of Chemistry, Warsaw University of Technology, Noakowskiego 3, Warsaw, Poland

Abstract

A method for the determination of silicon in organic solutions was developed using a double focusing magnetic sector ICP MS operating at a resolution of 4000. The signal-to-background ratio was improved 10-fold over standard sample introduction systems by the use of micro-flow injection total consumption sample introduction. The detection limits down to 1 ng g−1, the calibration graph linear over 4 orders of magnitude and precision to within a few percent were obtained. The effects of the sample matrix and of the chemical form of silicon on the sensitivity were investigated and alleviated when necessary by heating the spray chamber and sample dilution. Normal phase HPLC-ICP MS and size-exclusion ICP MS were proposed to gain an insight into the purity of the silicon standard compounds, their reactivity with different petroleum-related matrices and speciation of silicon.

Graphical abstract: Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

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Article information

DOI
https://doi.org/10.1039/C005010E
Article type
Paper
Submitted
09 Apr 2010
Accepted
28 May 2010
First published
28 Jun 2010

J. Anal. At. Spectrom., 2010,25, 1461-1466

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Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

P. Pohl, N. Vorapalawut, B. Bouyssiere and R. Lobinski, J. Anal. At. Spectrom., 2010, 25, 1461 DOI: 10.1039/C005010E

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