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Investigation of the Metal–Oxide Buried Interfacial Zone with Linear Sweep Voltammetry

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Abstract

Interest in copper as a technologically important material needs to be met with greater understanding of the fundamental chemical reactions of copper. In particular, there is still a lack of universal agreement on the oxidation process of bulk copper and thin copper films. In this study, the authors demonstrate the use of linear sweep voltammetry (LSV) to study buried structures in the oxide layers on copper. In particular, LSV can be used to detect reactions at buried interfaces. It is also emphasized that surface scientists should recognize Cu3O2 and the decomposition of copper oxides at the metal–oxide interface in new studies on copper oxidation and in interpreting already existing copper oxidation data. The two key parameters that drive oxide growth and decomposition are demonstrated to be oxygen activity and the free energies of formation of the oxides (per mole of oxide ion). The complex nature of the oxidation of copper, as well as other metals and alloys, can be described qualitatively using the Modified Cabrera–Mott (C–M) Model. Surface studies of oxidation of metals and alloys need to be supported and complemented by other techniques such as chemical or electrochemical methods.

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References

  1. D.L. Cocke, in Proceedings of XXII Congresso Internaciaonal de Metalurgia y Materiales, November 2000, (Instituto Technologico de Saltillo, Saltillo, Coahuila, Mexico) p. xiv.

    Google Scholar 

  2. E. Apen, B.R. Rogers and J.A. Sellers, J. Vac. Sci. Technol. 16 (1998) 1227.

    Google Scholar 

  3. H.Y.H. Chan, C.G. Takoudis and M.J. Weaver, Electrochem. Solid State Lett. 2 (1999) 189.

    Google Scholar 

  4. J. Li, J.W. Mayer and E.G. Colgan, J. Appl. Phys. 70 (1991) 2820.

    Google Scholar 

  5. M. Rauh and P. Wissmann, Thin Solid Films 228 (1993) 121.

    Google Scholar 

  6. K. Hono, H. Pickering, T. Hashizume, I. Kamiya and T. Sakurai, Surf. Sci. 213 (1989) 90.

    Google Scholar 

  7. R. Garcia-Cantu, J.J. Alvarado and O. Solorza, J. Microsc. 171 (1993) 167.

    Google Scholar 

  8. D.L. Cocke, G.K. Chuah, N. Kruse and J.H. Block, Appl. Sur. Sci. 84 (1995) 153.

    Google Scholar 

  9. J.M. Machefert, M. Lenglet, D. Blavette, A. Menard and A.D 'Huysser, ‘Structure and Reactivity of Surfaces’ (Elsevier, Amsterdam, 1989) p. 625.

    Google Scholar 

  10. T. Barr, J.Phys. Chem. 82 (1978) 1801.

    Google Scholar 

  11. C. Yoon and D.L. Cocke, Appl.Surf. Sci. 31 (1988) 118.

    Google Scholar 

  12. C.H. Yoon and D.L. Cocke, J. Electrochem. Soc. 134 (1987) 643.

    Google Scholar 

  13. H. Streblow and B. Titze, Electrochim. Acta 25 (1980) 839.

    Google Scholar 

  14. G.N. Raikar, J.C. Gregory and P.N. Peters, Oxid. Met. 42 (1994) 1.

    Google Scholar 

  15. M. Lenglet, K. Kartouni, J. Machefert, J.M. Claude, P. Steinmetz, E. Beauprez, J. Heinrich and N. Celati, Mat. Res. Bull. 30 (1995) 393.

    Google Scholar 

  16. B. Lefez, K. Kartouni, M. Lenglet, D. Ronnow and C.G. Ribbing, Surf. Int. Anal. 22 (1994) 451.

    Google Scholar 

  17. M. Lenglet, K. Kartouni and D. Delehaye, J. Appl. Electrochem. 21 (1991) 697.

    Google Scholar 

  18. H. Weider and A.W. Czanderna, J. Phys. Chem. 28 (1962) 816.

    Google Scholar 

  19. E.G. Clarke and A.W. Czanderna, Surf. Sci. 49 (1975) 529.

    Google Scholar 

  20. M.G. Hapse, M.K. Gharpurey and A.B. Biswas, Surf. Sci. 9 (1968) 87.

    Google Scholar 

  21. H. Neumeister and W. Jaenicke, Z. Phys Chem. Neue Folge 108 (1978) 217.

    Google Scholar 

  22. A.W. Czanderna and H. Wieder, in R.F. Walker (Ed), ‘Vacuum Microbalance Techniques’, Vol. 2 (Plenum Press, Inc., New York, 1962) p. 147.

    Google Scholar 

  23. S. Suzuki, Y. Ishikawa, M. Isshiki and Y. Wsaeda, Mater. Trans. JIM 38 (1997) 1004.

    Google Scholar 

  24. H. Bubert and T. Appel, J. Microsc. Soc. Am. 2 (1996) 35.

    Google Scholar 

  25. M.O 'Reilly, X. Jaing, J.T. Beechinor, S. Lynch, C. NìDheasuna, J.C. Patterson and G.M. Crean, Appl. Surf. Sci. 91 (1995) 152.

    Google Scholar 

  26. S.K. Roy, S.K. Bose and S.C. Sircar, Oxid. Met. 35 (1991) 1.

    Google Scholar 

  27. S.-Y. Lee, S.-H. Choi and C.-O. Park, Thin Solid Films 359 (2000) 261.

    Google Scholar 

  28. J.C. Yang, B. Kolasa and J.M. Gibson, Appl. Phys. Let. 73 (1998) 2841.

    Google Scholar 

  29. M. Rauh, H.-U. Finzel and P. Wissmann, Z. Naturforsch. 54a (1999) 117.

    Google Scholar 

  30. O. Forsén, P. Personen, J. Aromaa and T. Sourtti, Trans. IMF 75 (1997) 65.

    Google Scholar 

  31. H. Wieder and A.W. Czanderna, J. Appl. Phys. 37 (1966) 184.

    Google Scholar 

  32. P.K. Krishnamoorthy and S.C. Sircar, Oxid. Met. 2 (1970) 349.

    Google Scholar 

  33. R. Schennach, M.Y.A. Mollah, J.R. Parga and D.L. Cocke, in Proceedings of XXII Congresso Internaciaonal de Metalurgia y Materiales, November 2000, (Instituto Technologico de Saltillo, Saltillo, Coahuila, Mexico) 122.

    Google Scholar 

  34. H. Bubert, E. Grallath, A. Quentmeier and M. Wielunski, Fresenius J. Anal. Chem. 353 (1995) 456.

    Google Scholar 

  35. D.E. Mencer, M.A. Hossain, J.R. Parga and D.L. Cocke, J.Mat. Sci. Lett. 21 (2002) 125.

    Google Scholar 

  36. D.E. Mencer, M.A. Hossain, J.R. Parga and D.L. Cocke, J.Mat. Sci. Lett. 21 (2002) 1143.

    Google Scholar 

  37. M.A. Hossain, D.E. Mencer, M. Kesmez, R. Schennach, M.Y.A. Mollah, D.G. Naugle and D.L. Cocke, unpublished data.

  38. N. Bellakhal, K. Draou and J.L. Brisset, J. Appl. Electrochem. 27 (1997) 414.

    Google Scholar 

  39. D.E. Mencer, Jr., D.L. Cocke and C. Yoon, Surf. Int. Anal. 17 (1991) 31.

    Google Scholar 

  40. D.L. Cocke, M.S. Owens and R.B. Wright, Appl. Surf. Sci. 31 (1988) 341.

    Google Scholar 

  41. D.L. Cocke and M.S. Owens, Appl. Surf. Sci. 31 (1988) 471.

    Google Scholar 

  42. D.L. Cocke, G. Liang, M. Owens, D.E. Halverson and D.G. Naugle, Mater. Sci. Eng. 99 (1988) 497.

    Google Scholar 

  43. D.L. Cocke, M.S. Owens and R.B. Wright, Langmuir. 4 (1988) 1311.

    Google Scholar 

  44. D.L. Cocke and M.S. Owens, J. Colloid and Interf. Sci. 19 (1989) 166.

    Google Scholar 

  45. D.L. Cocke, T.R. Hess, T. Mebrahtu, D.E. Mencer, Jr. and D.G. Naugle, Solid State Ionics, 43 (1990) 119.

    Google Scholar 

  46. T. Mebrahtu, T.R. Hess, D.E. Mencer, Jr., K.G. Balke, D.G. Naugle and D.L. Cocke, Mater. Sci. Eng. A134 (1991) 1041.

    Google Scholar 

  47. D.E. Mencer Jr., T.R. Hess, T. Mebrahtu, D.L. Cocke and D.G. Naugle, J. Vacuum Sci. Tech. A9 (1991) 1610.

    Google Scholar 

  48. J.M. Bailey and I.M. Ritchie, Oxid. Met. 30 (1988) 405.

    Google Scholar 

  49. J.M. Bailey and I.M. Ritchie, Oxid. Met. 30 (1988) 419.

    Google Scholar 

  50. V.P. Parkhutik, J.Phys. D: Appl. Phys. 25 (1992) 256.

    Google Scholar 

  51. C. Yoon, ‘A Surface Segregation and Oxidation Study of Alloys With Unique Electronic Properties-Implications in Catalysis and Corrosion’, Dissertation, Texas A & M University, 1986.

  52. T.A. Delchar and F.C. Tompkins, Proc. R. Soc. London A300 (1967) 141.

    Google Scholar 

  53. A. Srinivasan, K, Jagannathan, M.S. Hedge and C.N.R. Rao, Indian J. Chem. 18A (1979) 463.

    Google Scholar 

  54. C.N.R. Rao, D.D. Sarma and M.S. Hedge, Proc. R. Soc. London A370 (1980) 269.

    Google Scholar 

  55. M.J. Braithwaite, R.W. Joyner and M.W. Roberts, J. Chem. Soc. Faraday Diss. 60 (1975) 89.

    Google Scholar 

  56. D.E. Mencer, ‘Preparation and Characterization of Strongly Interacting Amorphous and Polycrystalline Alloys: AgMn and TiAl’,Dissertation, Texas A & M University, 1991.

  57. D.E. Mencer, T.R. Hess, T. Mebrahtu, J. Patschieder, D.G. Naugle, and D.L. Cocke, J. Chem. Soc. Chem. Commun. Issue 22 (1990) 1602.

    Google Scholar 

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Authors and Affiliations

  1. Gill Chair of Chemistry and Chemical Engineering, Lamar University, Beaumont, TX, 77710, USA; (e-mail:

    D.L. Cocke & M.A. Hossain

  2. Department of Chemistry, Wilkes University, Wilkes-Barre, PA, 18776, USA

    D.E. Mencer

  3. Institute of Solid State Physics, Technical University of Graz, Austria

    R. Schennach

  4. Gill Chair of Chemistry and Chemical Engineering, Lamar University, Beaumont, TX, 77710, USA

    M. Kesmez

  5. Department of Metallurgy and Materials Science, Institute Technology of Saltillo, V. Carranza, 2400, Saltillo Coah, Mexico, C.P. 25000

    J.R. Parga

  6. Department of Physics, Texas A & M University, College Station, TX, 77843, USA

    D.G. Naugle

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  1. D.L. Cocke
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  4. R. Schennach
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Cocke, D., Mencer, D., Hossain, M. et al. Investigation of the Metal–Oxide Buried Interfacial Zone with Linear Sweep Voltammetry. Journal of Applied Electrochemistry 34, 919–927 (2004). https://doi.org/10.1023/B:JACH.0000040496.10467.5b

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