A Random Coefficient Degradation Model With Ramdom Sample Size

Abstract

In testing product reliability, there is often a critical cutoff level that determines whether a specimen is classified as “failed.” One consequence is that the number of degradation data collected varies from specimen to specimen. The information of random sample size should be included in the model, and our study shows that it can be influential in estimating model parameters. Two-stage least squares (LS) and maximum modified likelihood (MML) estimation, which both assume fixed sample sizes, are commonly used for estimating parameters in the repeated measurements models typically applied to degradation data. However, the LS estimate is not consistent in the case of random sample sizes. This article derives the likelihood for the random sample size model and suggests using maximum likelihood (ML) for parameter estimation. Our simulation studies show that ML estimates have smaller biases and variances compared to the LS and MML estimates. All estimation methods can be greatly improved if the number of specimens increases from 5 to 10. A data set from a semiconductor application is used to illustrate our methods.