Abstract
We have measured the transmittance of several polyimide (C22H10N2O4) films at wave numbers from 6000 to 500 cm−1 (wavelengths from 1.67 to 20 μm) using a Fourier-transform infrared (FT-IR) spectrometer. The free-standing polyimide films are made by spin coating and thermal curing processes. The thickness of the films ranges from 0.1 to 4 μm. In the nonabsorbing region from 6000 to 4000 cm−1, the minimum transmittance caused by interference is used to obtain the refractive index for film thicknesses greater than 1 μm. The film thicknesses are determined by fitting the spectral transmittance using the refractive index. Molecular absorption strongly reduces the transmittance at wave numbers from 2000 to 500 cm−1. The optical constants, i.e., the refractive index and the extinction coefficient, are determined from the measured transmittance for several films of different thickness using a least-squares method. A Lorentzian oscillator model is also developed, which in general agrees well with the measured transmittance at wave numbers from 6000 to 500 cm−1. This study will facilitate the application of polyimide films in the fabrication of infrared filters and other optoelectronic applications. The methods presented in this paper can be used to determine the optical constants of other types of thin-film materials.
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REFERENCES
A. M. Wilson, in Polyimides: Synthesis, Characterization and Applications, K. L. Mittal, ed. (Plenum, New York, 1984), Vol. 2, p. 715.
T. Verbiest, D. M. Burland, M. C. Jurich, V. Y. Lee, R. D. Miller, and W. Volksen, Science 268:1604 (1995).
R. Wolf, H.-G. Birken, and C. Kunz, Appl. Opt. 31:7313 (1992).
F. R. Powell, R. A. M. Keski-Kuha, M. V. Zombeck, R. E. Goddard, G. Chartas, L. K. Townsley, E. Möbius, J. M. Davis, and G. M. Mason, in Grazing Incidence and Multilayer X-Ray Optical Systems, Vol. 3113, R. B. Hoover and A. B. Walker, eds. (SPIE, Bellingham, WA, 1997). pp. 432–440.
K. W. Kim, C. E. Hong, S. C. Choi, S. J. Cho, C. N. Whang, T. E. Shim, and D. H. Lee, J. Vac. Sci. Technol. A12:3180 (1994).
C. D. Dimitrakopoulos, S. P. Kowalczyk, and K.-W. Lee, Polymer 36:4983 (1995).
H. Ishida and M. T. Huang, Mikrochim. Acta 51A:319 (1995).
M. Saito, T. Gojo, Y. Kato, and M. Miyagi, Infrared Phys. Technol. 36:1125 (1995).
T. C. Kowalczyk, T. Z. Kosc, K. D. Singer, A. J. Beuhler, D. A. Wargowski, P. A. Cahill, C. H. Seager, M. B. Meinhardt, and S. Ermer, J. Appl. Phys. 78:5876 (1995).
U. Goeschel, H. Lee, D. Y. Yoon, R. L. Siemens, B. A. Smith, and W. Volksen, Colloid Polymer Sci. 272:1388 (1994).
A. Frenkel and Z. M. Zhang, Opt. Lett. 19:1495 (1994).
Z. M. Zhang, L. M. Hanssen, J. J. Hsia, R. U. Datla, C. Zhu, and P. R. Griffiths, Mikrochim. Acta Suppl. 14:315 (1997).
M. I. Flik and Z. M. Zhang, J. Quant. Spectrosc. Radiat. Transfer 47:293 (1992).
D. Gupta, L. Wang, L. M. Hanssen, J. J. Hsia, and R. U. Datla, Polystyrene Films for Calibrating the Wavelength Scale of Infrared Spectrophotometers—SRM 1921, NIST SP 260-122 (U.S. Government Printing Office, Washington DC, 1995).
Z. M. Zhang, J. Heat Transfer 119:645 (1997).
M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980), Chaps. 1, 13.
W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes in Fortran, 2nd ed. (Cambridge University Press, Cambridge, 1992), Chap. 15.
C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley, New York, 1983), Chap. 9.
Z. M. Zhang, B. I. Choi, M. I. Flik, and A. C. Anderson, J. Opt. Soc. Am. B11:2252 (1994).
Z. M. Zhang, L. M. Hanssen, and R. U. Datla, Infrared Phys. Technol. 37:539 (1996).
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Zhang, Z.M., Lefever-Button, G. & Powell, F.R. Infrared Refractive Index and Extinction Coefficient of Polyimide Films. International Journal of Thermophysics 19, 905–916 (1998). https://doi.org/10.1023/A:1022655309574
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DOI: https://doi.org/10.1023/A:1022655309574