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Solid State Communications
Volume 133, Issue 9, March 2005, Pages 611-614
 
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doi:10.1016/j.ssc.2004.10.035    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2005 Elsevier Ltd All rights reserved.

Enhanced ferroelectric properties of vanadium doped bismuth titanate (BTV) thin films grown by pulsed laser ablation technique

Ayan Roy Chaudhuri, Apurba Laha and S.B. KrupanidhiCorresponding Author Contact Information, E-mail The Corresponding Author

Materials Research Centre, Indian Institute of Science, Bangalore 560 012, India

Received 29 September 2004; 
accepted 25 October 2004. 
by C.N.R. Rao. 
Available online 7 January 2005.

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Abstract

Bi3.99Ti2.97V0.03O12 (BTV) thin films were grown by pulsed laser deposition at substrate temperatures ranging between 650 and 750 °C. The structural phase, and orientation of the deposited films were investigated in order to understand the effect of the deposition parameters on the properties of the BTV films. As the substrate temperature was increased to 700 °C, the films started showing a tendency of assuming a c-axis preferred orientation, while at lower temperatures polycrystalline films were formed. The Au/BTV/Pt capacitor showed an interesting dependence of the remnant polarization (Pr) as well as dc leakage current values on the growth temperature. The film deposited at 675 °C showed a very large 2Pr of 42 μC cm−2, which is the largest for BTV thin films among the values reported so far.

Keywords: A. BTV thin films; B. Laser ablation; D. Remnant polarization; D. Electrical properties

PACS: 77.80.−e

Article Outline

1. Introduction
2. Experimental
3. Results and discussion
4. Conclusion
References






 
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