doi:10.1016/j.patrec.2005.01.017
Copyright © 2005 Elsevier B.V. All rights reserved.
Stochastic texture analysis for monitoring stochastic processes in industry
Jacob Scharcanski
, 
Instituto de Informática, UFRGS–Universidade Federal do Rio Grande do Sul, Av. Bento Gonçalves, 9500, Porto Alegre, RS, 91501-970, Brazil
Received 2 February 2004;
revised 28 September 2004.
Communicated by E. Backer.
Available online 14 April 2005.
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Abstract
Several continuous manufacturing processes use stochastic texture images for quality control and monitoring. Large amounts of pictorial data are acquired, providing both important information about the materials produced and about the manufacturing processes involved. However, it is often difficult to measure objectively the similarity among such images, or to discriminate between texture images of materials with distinct properties. The degree of discrimination required by industrial processes sometimes goes beyond the limits of human visual perception. This work presents a new method for multi-resolution stochastic texture analysis, interpretation and discrimination based on the wavelet transform. A multi-resolution distance measure for stochastic textures is proposed, and applications of our method in the non-woven textiles industry are reported. The conclusions include ideas for future work.
Keywords: Stochastic textures; Wavelets; Anisotropy; Nonwoven textiles
Fig. 1. Comparative results for isotropic and anisotropic test samples. Stochastic texture images: (a) nearly isotropic and (b) anisotropic; Gaussian ellipses: (c) nearly isotropic and (d) anisotropic; histograms of local gradient magnitudes (solid-Rayleigh model): (e) nearly isotropic and (f) anisotropic.
Fig. 2. Normal plots: (a) nearly isotropic and (b) anisotropic. Web uniformity testing results: (c) sample anisotropy ranking (our approach: solid; tensile test: dotted); (d) anisotropy measurements across the web (our approach: solid; tensile test: dotted); (e) distance
profile (standard operating conditions); (f) distance
profile (non-standard operating conditions).
Table 1.
Measured correct classification rate and computational costs: GRD, KL is our approach, i.e. bivariate Gaussian and Rayleigh models, and Kullback–Leibler distance (α = 0.15); 2G, KL is the approach of bivariate Gaussian model for the wavelet coefficients, and Kullback–Leibler distance; Gabor, Euclid. is the approach of Gabor filters, and Euclidean distance; SGLDM, Euclid. is the approach of SGLDM, and Euclidean distance; and Rayl., KL is the approach of Rayleigh model for the gradient magnitudes, and Kullback–Leibler distance
