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Pattern Recognition Letters
Volume 26, Issue 11, August 2005, Pages 1701-1709
 
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doi:10.1016/j.patrec.2005.01.017    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2005 Elsevier B.V. All rights reserved.

Stochastic texture analysis for monitoring stochastic processes in industry

Jacob ScharcanskiCorresponding Author Contact Information, E-mail The Corresponding Author

Instituto de Informática, UFRGS–Universidade Federal do Rio Grande do Sul, Av. Bento Gonçalves, 9500, Porto Alegre, RS, 91501-970, Brazil

Received 2 February 2004; 
revised 28 September 2004. 
Communicated by E. Backer. 
Available online 14 April 2005.

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Abstract

Several continuous manufacturing processes use stochastic texture images for quality control and monitoring. Large amounts of pictorial data are acquired, providing both important information about the materials produced and about the manufacturing processes involved. However, it is often difficult to measure objectively the similarity among such images, or to discriminate between texture images of materials with distinct properties. The degree of discrimination required by industrial processes sometimes goes beyond the limits of human visual perception. This work presents a new method for multi-resolution stochastic texture analysis, interpretation and discrimination based on the wavelet transform. A multi-resolution distance measure for stochastic textures is proposed, and applications of our method in the non-woven textiles industry are reported. The conclusions include ideas for future work.

Keywords: Stochastic textures; Wavelets; Anisotropy; Nonwoven textiles

Article Outline

1. Introduction
2. Our proposed texture representation
2.1. Texture directionality in multiple resolutions
2.2. Texture local graylevel variability in multiple resolutions
3. A stochastic texture distance measure
4. Experimental results
5. Concluding remarks
Acknowledgements
References



Pattern Recognition Letters
Volume 26, Issue 11, August 2005, Pages 1701-1709
 
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