Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis
Introduction
After the development of blue LED package in 1994 and the commercialization of white LED package, the lighting industry became more environmentally friendly with longer lifetime products. In Korea, the safety certification standards have been steadily established from 2009 with current 37 standards by various product types. However, there have been concerns on the method for evaluating the reliability of the LED package and also of the self-ballasted LED lamps which includes the power source. This paper will discuss the accelerated factors which were driven by many preceding studies and integrate the accelerated factors (temperature and electric stress) which have the biggest effects on the self-ballasted LED lamps lumen degradation. First, to verify the influence of temperature on the degradation of the self-ballasted LED lamps, accelerated stress tests at several temperature levels were performed. The lumen degradation test at the normal temperature condition was also performed to compare its result to that obtained at the accelerated conditions. Before we discuss the accelerated conditions, we first need a lumen degradation data of single LED package's temperature for long term test. Normal life test (25 °C) and thermal accelerated life test (70 °C, 90 °C) were first conducted on the low power LED package (3 V, 64 mA). Then the normal temperature (25 °C) plus 30 s on and 30 s off test and thermal accelerated life test plus 30 s on and 30 s off test were conducted on the self-ballasted LED lamps (8 W, 16 W) made with the same low power LED (3 V, 63 mA) installed on the Metal PCB. Input power was from 100 to 240 V of working Voltage and total lumen flux was 480 lm. Fig. 1 shows the test sample of a single LED package and the self-ballasted LED lamps (8 W, 16 W). In IEC 62621 (Self-ballasted LED Lamps for general Lighting services with supply voltages > 50 V — Performance requirements) the criteria of failure is below the minimum 70% of the initial lumen. In this research this criteria is used as a base for determining the failure data using Weibull analysis. Chan et al. recommended LED's activation energy to be 0.33 eV when using Weibull analysis [5]. Therefore, we adopted this Weibull analysis for HAST testing results. The total test condition for the research are designed following the below Table 1. The normal life test have been conducted following the test condition with temperature of 25 °C, tolerance of ± 1 °C and a relative humidity of 65% maximum as indicated in IEC 62612 for minimum of 4000 h to maximum of 10,000 h (one and a half year).
Section snippets
Experiment 1 (Single LED Life Testing)
Yoon et al. mentioned that Korean products of low power LED (30 mA, under 1 W) which contain the commercialized YAG type phosphor have the values of the shape parameter between 11 and 14 [4] at 25 °C, 70 °C and 90 °C when using Weibull analysis. So we chose a similar YAG type LED which the K-factor was 1.24–1.28 mV/ °C and thermal resistance was 32.62–33.97 °C/W. Fig. 2 shows the lumen degradation pattern obtained from normal life test with temperature at 25 °C, 70 °C and 90 °C. The graph shows the mean
Experiment 2 (LED Lamp Life Testing)
The test samples used for normal life test and thermal accelerated life test were 8 W (Operating Voltage 110 V–240 V, 50–60 Hz, 484 lm, 5203 K) and 16 W (Operating Voltage 110 V–280 V, 50–60 Hz, 989 lm, 5547 K) self-ballasted LED lamps of same LED package model (3 V, 63 mA). The biggest problem of this product is consumer's claims due to poor lighting. As to resolve this problem we analyzed the defected product and causing the problem for less than 1 year. The part with highest claim's defect factors had 13
Conclusion
In Table 7, the parameter estimates of lumen degradation curve obtained from normal life test and thermal accelerated life test are listed. Using the decay rate constant b1 from the LED normal life test as a base value, interesting result can be deducted showing the effect of temperature increase, number of increase in LED and 30 s on-off testing. First, the effect of temperature on LED was less than double but when the number of LED increased the effect of temperature increased from 3 to 6
References (6)
Historical overview and future of optoelectronics reliability for optical communication systems
Microelectron. Reliab.
(2000)- et al.
Conclusion of the accelerated stress condition affecting phosphor-converted LEDs using the fractional factorial design method
Microelectron. Reliab.
(2013) - et al.
Accelerated life test of high power white light emitting diodes based on package failure mechanisms
Microelectron. Reliab.
(2011)
Cited by (12)
Determining the thermal stress limit of LED lamps using highly accelerated decay testing
2016, Applied Thermal EngineeringCitation Excerpt :Furthermore, given the complex system integration of LED lamps, the entire system has been separated into several subsystems, such that each subsystem can undergo a reliability test using the highest possible stress levels; a step-stress accelerated degradation method for LED lamps has also been developed [11]. The lumen maintenance lifetimes of self-ballasted LED lamps at three temperatures have also been compared with those of an LED package through simple linear regression analysis [12]. The duration of accelerated reliability tests can be reduced effectively when the highest possible stress levels are applied.
Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis
2022, Reliability of Organic Compounds in Microelectronics and Optoelectronics: From Physics-of-Failure to Physics-of-DegradationMachine Learning and Digital Twin Driven Diagnostics and Prognostics of Light-Emitting Diodes
2020, Laser and Photonics ReviewsGarbage transport system in the final shelter city of samarinda with hauled container system (Hcs)
2020, International Journal of Scientific and Technology Research