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Microelectronics Journal
Volume 36, Issue 10, October 2005, Pages 913-916
SLAFES - SLAFES XVI proceedings
 
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doi:10.1016/j.mejo.2005.05.009    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2005 Elsevier Ltd All rights reserved.

Surface scaling analysis of hydrogels: From multiaffine to self-affine scaling

G.M. Buendíaa, Corresponding Author Contact Information, E-mail The Corresponding Author, S.J. Mitchellb and P.A. Rikvoldc

aDepartamento de Física, Universidad Simón Bolívar, Caracas 1080, Venezuela bDepartment of Chemistry and Chemical Engineering, Shuit Institute for Catalysis, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands cDepartment of Physics, Center for Materials Research and Technology, School of Computational Science and Information Technology, Department of Physics, Center for Materials Research and Technology and School of Computational Science. Florida State University, Tallahassee, Florida 32306-4350, USA

Available online 27 June 2005.

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Abstract

We show that smoothing of multiaffine surfaces that are generated by simulating a crosslinked polymer gel by a frustrated, triangular network of springs of random equilibrium lengths [G. M. Buendía, S. J. Mitchell, P. A. Rikvold, Phys. Rev. E, 66 (2002) 046119] changes the scaling behavior of the surfaces such that they become self-affine. The self-affine behavior is consistent with recent atomic force microscopy (AFM) studies of the surface structure of crosslinked polymer gels into which voids are introduced through templating by surfactant micelles [M. Chakrapani, S. J. Mitchell, D. H. Van Winkle, P. A. Rikvold, J. Colloid Interface Sci. 258 (2003) 186]. The smoothing process mimics the effect of the AFM tip that tends to flatten the soft gel surfaces. Both the experimental and the simulated surfaces have a non-trivial scaling behavior on small length scales, with a crossover to scale-independent behavior on large scales.

Keywords: Self-affine scaling; Multiaffine scaling; Hydrogels; Atomic force microscopy

PACS: 61.43.Hv; 89.75.Da; 82.70.Gg; 68.37.Ps

Article Outline

1. Introduction
2. The frustrated spring-network model
3. Calculations
4. Conclusions
Acknowledgements
References




Microelectronics Journal
Volume 36, Issue 10, October 2005, Pages 913-916
SLAFES - SLAFES XVI proceedings
 
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