doi:10.1016/j.compchemeng.2004.06.013
Copyright © 2004 Elsevier Ltd All rights reserved.
A strong tracking predictor for nonlinear processes with input time delay
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D. Wanga, D.H. Zhoua,
,
, Y.H. Jina and S. Joe Qinb
aDepartment of Automation, Tsinghua University, Beijing 100084, PR China
bDepartment of Chemical Engineering, University of Texas at Austin, Austin, TX 78712, USA
Received 2 February 2004;
revised 21 June 2004;
accepted 21 June 2004.
Available online 31 July 2004.
Abstract
Nonlinear state prediction is of crucial importance to design controllers for nonlinear processes with input time delay. In this paper, the extended nonlinear state predictor (ENSP) we proposed is first outlined, which is used to predict the future states of a class of nonlinear processes with input time delay. A new concept of strong tracking predictor (STP) is then proposed, and an orthogonality principle is given as a criterion to design the STP. On the basis of the orthogonality principle, the ENSP is modified, which results in a STP. After the detailed STP algorithm is presented, we prove that the STP is locally asymptotically convergent for a class of nonlinear deterministic processes if some sufficient conditions are satisfied. In the presence of measurement noise, it is further proved that the proposed STP is exponentially bounded under certain conditions. Finally, computer simulations with a MIMO nonlinear model are presented, which illustrate that the proposed STP can predict accurately the future states of a class of nonlinear time delay processes no matter whether the states change suddenly or slowly, in addition, it has definite robustness against model/plant mismatches.
Keywords: Nonlinear processes; Input time delay; State predictor; Extended Kalman filter; Orthogonality principle; Strong tracking predictor; Convergence analysis
Fig. 1. The layout of three-tank-system DTS200.
Fig. 2. Simulation results of STP in normal case. (a) Liquid levels h1, h2 and h3, (b) h1: true and its predictive value, (c) h2: true and its predictive value, and (d) h3: true and its predictive value.
Fig. 3. Simulation results of STP under overload disturbance. (a) Liquid levels h1, h2 and h3, (b) h1: true and its predictive value, (c) h2: true and its predictive value, and (d) h3: true and its predictive value.
Fig. 4. Simulation results of ENSP under overload disturbance. (a) Liquid levels h1, h2 and h3, (b) h1: true and its predictive value, (c) h2: true and its predictive value, and (d) h3: true and its predictive value.
Fig. 5. Simulation results of STP under model/process mismatches. (a) Liquid levels h1, h2 and h3, (b) h1: true and its predictive value, (c) h2: true and its predictive value, and (d) h3: true and its predictive value.
Table 1.
Some technical parameters of DTS200

Table 2.
Absolute predicted error sums of the ENSP and the STP


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