Speckle Metrology1978, Pages 225-2459.1 - Miscellaneous ApplicationsAuthor links open overlay panelRobert K. ErfShow moreOutlineShareCitehttps://doi.org/10.1016/B978-0-12-241360-5.50015-7Get rights and contentRecommended articlesReferences (0)Cited by (0)View full textCopyright © 1978 ACADEMIC PRESS, INC. Published by Elsevier Inc. All rights reserved.