Skip to main content
Log in

Influence of bias voltage on structure, mechanical and corrosion properties of reactively sputtered nanocrystalline TiN films

  • Published:
Journal of Iron and Steel Research International Aims and scope Submit manuscript

Abstract

Nanocrystalline TiN films were prepared by DC reactive magnetron sputtering. The influence of substrate biases on structure, mechanical and corrosion properties of the deposited films was studied using X-ray diffraction, field emission scanning electron microscopy, nanoindentation and electrochemical techniques. The deposited films have a columnar structure, and their preferential orientation strongly depends on bias voltage. The preferential orientations change from (200) plane at low bias to (111) plane at moderate bias and then to (220) plane at relatively high bias. Nanohardness H, elastic modulus E, H/E* and H3/E*2 ratios, and corrosion resistance of the deposited films increase first and then decrease with the increase in bias voltage. All the best values appear at bias of −120 V, attributing to the film with a fine, compact and less defective structure. This demonstrates that there is a close relation among microstructure, mechanical and corrosion properties of the TiN films, and the film with the best mechanical property can also provide the most effective corrosion protection.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. A. Bahri, E. Kaçar, S. S. Akkaya, K. Elleuch, M. Ürgen, Surf. Coat. Technol. 304 (2016) 560–566.

    Article  Google Scholar 

  2. W. Xiang, C. Zhao, K. Liu, G. Zhang, K. Zhao, J. Alloy. Compd. 658 (2016) 862–866.

    Article  Google Scholar 

  3. N. Jiang, H. J. Zhang, S. N. Bao, Y. G. Shen, Z. F. Zhou, Physica B 352 (2004) 118–126.

    Article  Google Scholar 

  4. P. Chen, X. Xiang, T. M. Shao, Y. Q. La, J. L. Li, Appl. Surf. Sci. 389 (2016) 361–368.

    Article  Google Scholar 

  5. B. Pecz, N. Frangis, S. Logothetidis, I. Alexandrou, P. B. Barna, J. Stoemenos, Thin Solid Films 268 (1995) 57–63.

    Article  Google Scholar 

  6. H. Liang, J. Xu, D. Zhou, X. Sun, S. Chu, Y. Bai, Ceram. Int. 42 A (2016) 2642–2647.

    Article  Google Scholar 

  7. D. M. Devia, E. Restrepo-Parra, P. J. Arango, A. P. Tschiptschin, J. M. Velez, Appl. Surf. Sci. 257 (2011) 6181–6185.

    Article  Google Scholar 

  8. X. Chen, Y. Xi, J. Meng, X. Pang, H. Yang, J. Alloy. Compd. 665 (2016) 210–217.

    Article  Google Scholar 

  9. N. D. Nam, J. G. Kim, W. S. Hwang, Thin Solid Films 517 (2009) 4772–4776.

    Article  Google Scholar 

  10. C. Yu, L. Tian, Y. Wei, S. Wang, T. Li, B. Xu, Appl. Surf. Sci. 255 (2009) 4033–4038.

    Article  Google Scholar 

  11. V. K. William Grips, H. C. Barshilia, V. Ezhil Selvi, Kalavati, K. S. Rajam, Thin Solid Films 514 (2006) 204–211.

    Article  Google Scholar 

  12. D. Zhang, L. Duan, L. Guo, W. H. Tuan, Int. J. Hydrogen Energy 35 (2010) 3721–3726.

    Article  Google Scholar 

  13. C. Liu, Q. Bi, A. Matthews, Corros. Sci. 43 (2001) 1953–1961.

    Article  Google Scholar 

  14. M. Flores, S. Muhl, L. Huerta, E. Andrade, Surf. Coat. Technol. 200 (2005) 1315–1319.

    Article  Google Scholar 

  15. C. H. Hsu, C. Y. Lee, Z. H. Lin, W. Y. Ho, C. K. Lin, Thin Solid Films 519 (2011) 4928–4932.

    Article  Google Scholar 

  16. J. W. Lee, S. T. Chang, H. W. Chen, C. H. Chien, J. G. Duh, C. J. Wang, Surf. Coat. Technol. 205 (2010) 1331–1338.

    Article  Google Scholar 

  17. C. L. He, J. L. Zhang, J. M. Wang, G. F. Ma, D. L. Zhao, Q. K. Cai, Appl. Surf. Sci. 276 (2013) 667–671.

    Article  Google Scholar 

  18. D. Q. Yin, Y. Yang, X. H. Peng, Y. Qin, Z. C. Wang, Physica E 63 (2014) 125–130.

    Article  Google Scholar 

  19. Y. X. Ou, J. Lin, H. L. Che, W. D. Sproul, J. J. Moore, M. K. Lei, Surf. Coat. Technol. 276 (2015) 152–159.

    Article  Google Scholar 

  20. M. Naddaf, B. Abdallah, M. Ahmad, M. A-Kharroub, Nucl. Instr. Meth. Phys. Res. B 381 (2016) 90–95.

    Article  Google Scholar 

  21. C. L. Chang, T. H. Chiou, P. H. Chen, W. C. Chen, C. T. Ho, W. Y. Wu, Surf. Coat. Technol. 303A (2016) 25–31.

    Article  Google Scholar 

  22. E. Alat, A. T. Motta, R. J. Comstock, J. M. Partezana, D. E. Wolfe, J. Nucl. Mater. 478 (2016) 236–244.

    Article  Google Scholar 

  23. J. J. Yang, F. F. Zhang, Q. Wan, C. Y. Lu, M. J. Peng, J. L. Liao, Y. Y. Yang, L. M. Wang, N. Liu, Appl. Surf. Sci. 389 (2016) 255–259.

    Article  Google Scholar 

  24. D. N. Lee, J. Mater. Sci. 24 (1989) 4375–4378.

    Article  Google Scholar 

  25. P. Patsalas, C. Charitidis, S. Logothetidis, Surf. Coat. Technol. 125 (2000) 335–340.

    Article  Google Scholar 

  26. S. Q. Rong, J. He, H. J. Wang, C. X. Tian, L. P. Guo, D. J. Fu, Plasma Sci. Technol. 11 (2009) 38–41.

    Article  Google Scholar 

  27. J. Musil, in: Albano Cavaleiro, Jeff Th. M. De Hosson (Eds.), Nanostructured Coatings, Springer Science & Business Media, New York, 2006, pp. 407–463.

    Chapter  Google Scholar 

  28. A. M. Pagon, J. G. Partridge, P. Hubbard, M. B. Taylor, D. G. McCulloch, E. D. Doyle, K. Latham, J. E. Bradby, K. B. Borisenko, G. Li, Surf. Coat. Technol. 204 (2010) 3552–3558.

    Article  Google Scholar 

  29. J. Musil, F. Kunc, H. Zeman, H. Polakova, Surf. Coat. Technol. 154 (2002) 304–313.

    Article  Google Scholar 

  30. S. Zhang, D. Sun, Y. Q. Fu, H. J. Du, Surf. Coat. Technol. 198 (2005) 2–8.

    Article  Google Scholar 

  31. L. Cunha, M. Andritschky, L. Rebouta, R. Silva, Thin Solid Films 317 (1998) 351–355.

    Article  Google Scholar 

  32. S. H. Ahn, J. H. Lee, J. G. Kim, J. G. Han, Surf. Coat. Technol. 177–178 (2004) 638–644.

    Article  Google Scholar 

  33. C. V. Franco, L. C. Fontana, D. Bechl, A. E. Martinelli, J. L. R. Muzart, Corros. Sci. 40 (1998) 103–112.

    Article  Google Scholar 

  34. S. Rudenja, J. Pan, I. O. Wallinder, C. Leygraf, P. Kulu, J. Electrochem. Soc. 146 (1999) 4082–4086.

    Article  Google Scholar 

  35. H. C. Barshilia, M. S. Prakash, A. Poojari, K. S. Rajam, Thin Solid Films 460 (2004) 133–142.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Chun-lin He Ph.D..

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

He, Cl., Zhang, Jl., Ma, Gf. et al. Influence of bias voltage on structure, mechanical and corrosion properties of reactively sputtered nanocrystalline TiN films. J. Iron Steel Res. Int. 24, 1223–1230 (2017). https://doi.org/10.1016/S1006-706X(18)30021-9

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1016/S1006-706X(18)30021-9

Key words

Navigation