Elsevier

Applied Superconductivity

Volume 6, Issues 10–12, October–November 1999, Pages 547-551
Applied Superconductivity

A superconducting 4 bit instantaneous frequency meter at 10 GHz with integrated resistors and air-bridges

https://doi.org/10.1016/S0964-1807(99)00010-1Get rights and content

Abstract

A fully integrated device on a single 2″-MgO wafer for a 4 bit instantaneous frequency measurement between 9.5 and 10.5 GHz has been developed with coplanar delay lines and power dividers. Due to integration of power divider resistors and a large number of air-bridges, improved transmission characteristics are achieved in a more reproducible way than with surface mounted chip-resistors and ultrasonically bonded air-bridges. The passive integrated circuit has 4 output signals and after threshold detection yields a one step binary code with a maximum resolution of ±31.25 MHz at a bandwidth of ∼1 GHz and a center frequency of ∼10 GHz. A 4 bit test vehicle with Nb-delay lines on a 2″-MgO substrate yields a total nonlinearity of 1/5 LSB corresponding to 12 MHz. Another test vehicle with YBCO-delay lines on a 2″-MgO substrate will also be discussed.

Introduction

A 4 bit instantaneous frequency measurement (IFM) subsystem for a bandwidth of 1 GHz at a center frequency of 10 GHz has already been implemented with Y1Ba2Cu3O7−δ coplanar delay lines on a single 2″-LaAlO3 substrate[1]. Wilkinson power dividers with hybrid resistors and ultrasonically bonded air bridges were used. To improve the transmission characteristics and the reproducibility a new device with integrated resistors and bridges on a single 2″-MgO substrate has been developed.

In this paper a fully integrated 4 bit IFM with integrated power dividers and a special coplanar delay line design with integrated bridges is presented. It can be easily fabricated with a superconducting film in only one plane, is mechanically stable (no problems during temperature cycles), and has a small volume and weight.

To use these advantages a careful design and simulation of coplanar structures and an optimisation of the deposition and structuring of different films are required since detection and correction of artifacts in analog complex microwave integrated circuits is not an easy task.

Section snippets

Basic design considerations

A 4 bit Instantaneous Frequency Measurement system for a frequency range between 9.5 and 10.5 GHz requires four interferometers with delay differences of 475, 1000, 2000 and 4000 ps[2]. The 4 way power divider and the 4 interferometers are integrated with coplanar waveguides on a 30×40 mm2 substrate of a 2″-MgO wafer (Fig. 1).

Detectors, amplifiers and 1 bit A/D-converters are implemented with semiconductors on separate substrates.

Test vehicle with Niobium delay lines

The feasibility of the integrated IFM concept is first tested with Nb delay lines on a 500 μm MgO substrate. The implemented coplanar delay lines with 90° bend sections are shown in Fig. 3.

The IFM comprises 11 integrated power dividers with integrated resistors. The delay of each interferometer is adjusted by the number of 90° bend line sections. 1280 sections are used for the LSB delay line, 640 for bit 3, 320 for bit 2 and 152 for the MSB. A total number of 2656 bridges is integrated on this

Prototype with YBCO delay lines

An integrated IFM with YBCO delay lines has been fabricated with the same coplanar delay line structure in Fig. 3. A micrograph of the 4 bit IFM on a 500 μm thick and 30×40 mm2 MgO substrate is shown in Fig. 6.

A 300 nm thick YBCO film with a CeO buffer layer has been deposited on a 2″-wafer by thermal coevaporation[7]. The films are etched with an Ar-ion beam through a resist mask on a stage cooled down to about 77 K[8]. The dielectric bricks are made of thermally evaporated SiO.

The interferometer

Acknowledgements

This work was supported in part by the German BMBF under Grant No. 13 N 6324 2.

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