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Pattern Recognition Letters
Volume 21, Issue 2, February 2000, Pages 117-130
 
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doi:10.1016/S0167-8655(99)00138-5    How to Cite or Link Using DOI (Opens New Window)
Copyright © 2000 Elsevier Science B.V. All rights reserved.

A Hough transform technique for the detection of reflectional symmetry and skew-symmetry

Raymond K. K. Yip Corresponding Author Contact Information, E-mail The Corresponding Author

Department of Electronic Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon Tong, Hong Kong

Received 27 August 1998; 
Revised 9 July 1999. 
Available online 14 February 2000.

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Abstract

In this paper, a simple and yet robust Hough transform algorithm is proposed to detect and analyze reflectional symmetry and skew-symmetry (reflectional symmetry under parallel projection). It is applicable to shapes that contain global, local and slightly deformed reflectional/skew-symmetries under the presence of noise and occlusion.

Author Keywords: Author Keywords: Reflectional symmetry; Skew-symmetry; Skew-symmetry axis; Skew-transverse angle; Hough transformation

Article Outline

1. Introduction
2. Properties and invariants of reflectional symmetry
3. Strategy of skew-symmetry recognition
3.1. Pass 1 – determine the skew-symmetry axis (ρss)
3.2. Pass 2 – determine the skew-transverse angle (φt)
3.3. Pass 3 – determine the skew-symmetric image points
4. A step-by-step example
5. Experimental results
6. Discussion
References








Pattern Recognition Letters
Volume 21, Issue 2, February 2000, Pages 117-130
 
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